机构

• 半导体研究所 [3]
• 高能物理研究所 [2]
• 苏州纳米技术与纳米仿... [1]

采集方式

• OAI收割 [5]
• iSwitch采集 [1]

内容类型

• 期刊论文 [6]

发表日期

• 2010 [5]
• 2005 [1]

学科主题

• 光电子学 [2]
• Chemistry;... [1]
• Physics [1]

筛选

浏览/检索结果: 共6条，第1-6条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Evaluation of both composition and strain distributions in ingan epitaxial film using x-ray diffraction techniques 期刊论文  iSwitch采集 Chinese physics b, 2010, 卷号: 19, 期号: 10, 页码: 7 作者:  Guo Xi;  Wang Hui;  Jiang De-Sheng;  Wang Yu-Tian;  Zhao De-Gang 收藏  |  浏览/下载：41/0  |  提交时间：2019/05/12 Ingan  In-plane grazing incidence x-ray diffraction  Reciprocal space mapping  Biaxial strain   Microstructure and strain analysis of GaN epitaxial films using in-plane grazing incidence x-ray diffraction 期刊论文  OAI收割 CHINESE PHYSICS B, 2010, 期号: 7 作者:  Yang H (杨辉);  Zhang SM;  Xu K (徐科);  Qiu YX (邱永鑫) 收藏  |  浏览/下载：28/0  |  提交时间：2010/12/30 in-plane grazing incidence x-ray diffraction  gallium nitride  mosaic structure  biaxial strain   Studies on strain relaxation and in-plane orientation of La0.7Ca0.3MnO3 film by grazing incidence X-ray diffraction 期刊论文  OAI收割 JOURNAL OF ALLOYS AND COMPOUNDS, 2010, 卷号: 491, 期号: 1-2, 页码: 545-549 作者:  Tan, WS;  Wu, HP;  Deng, KM;  Wu, XS;  Jia, QJ 收藏  |  浏览/下载：30/0  |  提交时间：2016/06/28 La0.7Ca0.3MnO3 film  Grazing incidence X-ray diffraction  Strain relaxation  In-plane growth orientation   Evaluation of both composition and strain distributions in InGaN epitaxial film using x-ray diffraction techniques 期刊论文  OAI收割 chinese physics b, 2010, 卷号: 19, 期号: 10, 页码: art. no. 106802 Guo X (Guo Xi); Wang H (Wang Hui); Jiang DS (Jiang De-Sheng); Wang YT (Wang Yu-Tian); Zhao DG (Zhao De-Gang); Zhu JJ (Zhu Jian-Jun); Liu ZS (Liu Zong-Shun); Zhang SM (Zhang Shu-Ming); Yang H (Yang Hui) 收藏  |  浏览/下载：35/0  |  提交时间：2010/11/02 InGaN  In-plane grazing incidence x-ray diffraction  reciprocal space mapping  biaxial strain  CRITICAL LAYER THICKNESS  OPTICAL-PROPERTIES  LATTICE-CONSTANTS  GAN  HETEROSTRUCTURES  ALLOYS  WELLS   Microstructure and strain analysis of GaN epitaxial films using in-plane grazing incidence x-ray diffraction 期刊论文  OAI收割 chinese physics b, 2010, 卷号: 19, 期号: 7, 页码: art. no. 076804 Guo X (Guo Xi); Wang YT (Wang Yu-Tian); Zhao DG (Zhao De-Gang); Jiang DS (Jiang De-Sheng); Zhu JJ (Zhu Jian-Jun); Liu ZS (Liu Zong-Shun); Wang H (Wang Hui); Zhang SM (Zhang Shu-Ming); Qiu YX (Qiu Yong-Xin); Xu K (Xu Ke); Yang H (Yang Hui) 收藏  |  浏览/下载：83/0  |  提交时间：2010/08/17 in-plane grazing incidence x-ray diffraction  gallium nitride  mosaic structure  biaxial strain  CHEMICAL-VAPOR-DEPOSITION  LATTICE-CONSTANTS  ALN   Possible abnormal mechanism for lattice strain relaxation in La0.7Ca0.3MnO3 thin film 期刊论文  OAI收割 INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2005, 卷号: 19, 期号: 15-17, 页码: 2415-2420 作者:  Tan, WS;  Jia QJ(贾全杰);  Jia, QJ;  Gao, J 收藏  |  浏览/下载：20/0  |  提交时间：2016/06/29 La0.7Ca0.3MnO3 film  grazing incidence X-ray diffraction  strain relaxation  in-plane lattice parameter