中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
首页
机构
成果
学者
登录
注册
登陆
×
验证码:
换一张
忘记密码?
记住我
×
校外用户登录
CAS IR Grid
机构
近代物理研究所 [18]
新疆理化技术研究所 [13]
金属研究所 [2]
新疆生态与地理研究所 [1]
上海微系统与信息技术... [1]
高能物理研究所 [1]
更多
采集方式
OAI收割 [36]
iSwitch采集 [1]
内容类型
期刊论文 [30]
会议论文 [6]
学位论文 [1]
发表日期
2025 [2]
2022 [1]
2021 [1]
2020 [2]
2018 [2]
2016 [1]
更多
学科主题
Physics [3]
Engineerin... [1]
Engineerin... [1]
筛选
浏览/检索结果:
共37条,第1-10条
帮助
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
发表日期升序
发表日期降序
题名升序
题名降序
提交时间升序
提交时间降序
作者升序
作者降序
The role of microstructural evolution in irradiation hardening of Alloy 718 under low dose proton irradiation
期刊论文
OAI收割
JOURNAL OF NUCLEAR MATERIALS, 2025, 卷号: 606, 页码: 13
作者:
Zhu, Haipeng
;
Zhang, Zhiming
;
Wang, Jianqiu
;
Ming, Hongliang
;
Zhang, Zhiyuan
  |  
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2025/04/27
Low dose proton irradiation
Alloy 718
Microstructure
Irradiation hardening
The role of microstructural evolution in irradiation hardening of Alloy 718 under low dose proton irradiation
期刊论文
OAI收割
JOURNAL OF NUCLEAR MATERIALS, 2025, 卷号: 606, 页码: 13
作者:
Zhu, Haipeng
;
Zhang, Zhiming
;
Wang, Jianqiu
;
Ming, Hongliang
;
Zhang, Zhiyuan
  |  
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2025/04/27
Low dose proton irradiation
Alloy 718
Microstructure
Irradiation hardening
1/f Noise responses of Ultra-Thin Body and Buried oxide FD-SOI PMOSFETs under total ionizing dose irradiation
期刊论文
OAI收割
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2022, 卷号: 176, 期号: 11-12, 页码: 1202-1214
作者:
Zhang, RQ (Zhang, Ruiqin) [1] , [2] , [3]
;
Zheng, QW (Zheng, Qiwen) [1] , [2]
;
Lu, W (Lu, Wu) [1] , [2]
;
Cui, JW (Cui, Jiangwei) [1] , [2]
;
Li, YD (Li, Yudong) [1] , [2]
  |  
收藏
  |  
浏览/下载:72/0
  |  
提交时间:2022/04/07
Total ionizing dose irradiation
UTBB FD-SOI
1
f noise
Meso-scale Discovery Assay Detects the Changes of Plasma Cytokine Levels in Mice after Low or High LET Ionizing Irradiation*
期刊论文
OAI收割
BIOMEDICAL AND ENVIRONMENTAL SCIENCES, 2021, 卷号: 34, 期号: 7, 页码: 540-551
作者:
Jia Rong
;
Chen Ya Xiong
;
Du Ya Rong
;
Hu Bu Rong
  |  
收藏
  |  
浏览/下载:52/0
  |  
提交时间:2021/12/08
MSD assay 
Low or high LET irradiation
Mouse 
plasma 
cytokines
Dose estimation model
Study of the influence of gamma irradiation on long-term reliability of SiC MOSFET
期刊论文
OAI收割
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2020, 卷号: 175, 期号: 5-6, 页码: 559-566
作者:
Liang, XW (Liang, Xiaowen)[ 1,2,3 ]
;
Cui, JW (Cui, Jiangwei)[ 1,2 ]
;
Zheng, QW (Zheng, Qiwen)[ 1,2 ]
;
Zhao, JH (Zhao, Jinghao)[ 1,2,3 ]
;
Yu, XF (Yu, Xuefeng)[ 1,2 ]
  |  
收藏
  |  
浏览/下载:56/0
  |  
提交时间:2020/12/11
SiC MOSFET
total ionizing dose irradiation
time-dependent dielectric breakdown
Degradation characteristics of electron and proton irradiated InGaAsP/InGaAs dual junction solar cell
期刊论文
OAI收割
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2020, 卷号: 206, 期号: 3, 页码: 1-7
作者:
Zhao, XF (Zhao, X. F.)[ 1 ]
;
Aierken, A (Aierken, A.)[ 1,2 ]
;
Heini, M (Heini, M.)[ 1,3 ]
;
Tan, M (Tan, M.)[ 4 ]
;
Wu, YY (Wu, Y. Y.)[ 4 ]
  |  
收藏
  |  
浏览/下载:57/0
  |  
提交时间:2020/04/21
InGaAsP/InGaAs solar cell
Electron and proton irradiation
Degradation
Equivalent displacement damage dose model
Estimation of enhanced low dose rate sensitivity mechanisms using temperature switching irradiation on gate-controlled lateral PNP transistor
期刊论文
OAI收割
CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 3, 页码: 1-9
作者:
Li, XL (Li, Xiao-Long)
;
Lu, W (Lu, Wu)
;
Wang, X (Wang, Xin)
;
Yu, X (Yu, Xin)
;
Guo, Q (Guo, Qi)
  |  
收藏
  |  
浏览/下载:57/0
  |  
提交时间:2018/05/14
Ionizing Radiation Damage
Enhanced Low Dose Rate Sensitivity (Eldrs)
Switched Temperature Irradiation
Gate-controlled Lateral Pnp Transistor (glPnp)
Using temperature-switching approach to evaluate the ELDRS of bipolar devices
期刊论文
OAI收割
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2018, 卷号: 172, 期号: 11-12, 页码: 824-834
作者:
Li, XL (Li, Xiaolong)
;
Lu, W (Lu, Wu)
;
Wang, X (Wang, Xin)
;
Guo, Q (Guo, Qi)
;
Yu, X (Yu, Xin)
  |  
收藏
  |  
浏览/下载:63/0
  |  
提交时间:2018/07/24
Bipolar Technology
Co-60 Gamma Irradiation
Enhanced Low-dose Rate Sensitivity (Eldrs)
Temperature-switching Approach (Tsa)
Impact of Bias Conditions on Total Ionizing Dose Effects of Co-60 gamma in SiGe HBT
期刊论文
OAI收割
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2016, 卷号: 63, 期号: 2, 页码: 1251-1258
作者:
Zhang, JX (Zhang, Jinxin)
;
Guo, Q (Guo, Qi)
;
Guo, HX (Guo, Hongxia)
;
Lu, W (Lu, Wu)
;
He, CH (He, Chaohui)
收藏
  |  
浏览/下载:66/0
  |  
提交时间:2016/12/12
Bias conditions
Co-60 gamma irradiation
SiGe HBT
total ionizing dose effect
Analysis of functional failure mode of commercial deep sub-micron SRAM induced by total dose irradiation
期刊论文
OAI收割
CHINESE PHYSICS B, 2015, 卷号: 24, 期号: 10
作者:
Zheng, QW (Zheng Qi-Wen)
;
Cui, JW (Cui Jiang-Wei)
;
Zhou, H (Zhou Hang)
;
Yu, DZ (Yu De-Zhao)
;
Yu, XF (Yu Xue-Feng)
  |  
收藏
  |  
浏览/下载:31/0
  |  
提交时间:2017/09/21
Total Dose Irradiation
Static Random Access Memory
Functional Failure Mode