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浏览/检索结果: 共83条，第1-10条 帮助

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Influence of doubly-hydrogenated oxygen vacancy on the TID effect of MOS devices 期刊论文  OAI收割
FRONTIERS IN MATERIALS, 2022, 卷号: 9
作者:  Lu, Guangbao;  Liu, Jun;  Zheng, Qirong;  Li, Yonggang
  |  收藏  |  浏览/下载：30/0  |  提交时间：2022/12/23
1/f Noise responses of Ultra-Thin Body and Buried oxide FD-SOI PMOSFETs under total ionizing dose irradiation 期刊论文  OAI收割
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2022, 卷号: 176, 期号: 11-12, 页码: 1202-1214
作者:  Zhang, RQ (Zhang, Ruiqin) [1] , [2] , [3];  Zheng, QW (Zheng, Qiwen) [1] , [2];  Lu, W (Lu, Wu) [1] , [2];  Cui, JW (Cui, Jiangwei) [1] , [2];  Li, YD (Li, Yudong) [1] , [2]
  |  收藏  |  浏览/下载：23/0  |  提交时间：2022/04/07
Experimental investigation on total-ionizing-dose radiation effects on the electrical properties of SOI-LIGBT 期刊论文  OAI收割
SOLID-STATE ELECTRONICS, 2021, 卷号: 175, 期号: 1, 页码: 1-7
作者:  Yang, GG (Yang, Guangan)[ 1 ];  Wu, WR (Wu, Wangran)[ 1 ];  Zhang, XY (Zhang, Xingyao)[ 2 ];  Tang, PY (Tang, Pengyu)[ 1 ];  Yang, J (Yang, Jing)[ 1 ]
  |  收藏  |  浏览/下载：26/0  |  提交时间：2021/03/15
Impact of TID on Within-Wafer Variability of Radiation-Hardened SOI Wafers 期刊论文  OAI收割
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021, 卷号: 68, 期号: 7, 页码: 1423-1429
作者:  Zheng, QW (Zheng, Qiwen) 1;  Cui, JW (Cui, Jiangwei) 1;  Yu, XF (Yu, Xuefeng) 1;  Li, YD (Li, Yudong) 1;  Lu, W (Lu, Wu) 1
  |  收藏  |  浏览/下载：22/0  |  提交时间：2021/08/06
Influence of enhanced low dose rate sensitivity on single-event transient degradation in the LM158 bipolar operational amplifier 期刊论文  OAI收割
AIP ADVANCES, 2021, 卷号: 11, 期号: 5, 页码: 1-6
作者:  Xiang, CAF (Xiang, Chuanfeng) 1 , 2;  Yao, S (Yao, Shuai) 1 , 3;  Lu, W (Lu, Wu) 1 , 2;  Li, XL (Li, Xiaolong) 1;  Yu, X (Yu, Xin) 1
  |  收藏  |  浏览/下载：50/0  |  提交时间：2021/08/06
Role of the oxide trapped charges in charge coupled device ionizing radiation-induced dark signal 期刊论文  OAI收割
RADIATION PHYSICS AND CHEMISTRY, 2021, 卷号: 189, 期号: 12, 页码: 1-5
作者:  Li, YD (Li, Yudong);  Liu, BK (Liu, Bingkai);  Wen, L (Wen, Lin);  Wei, Y (Wei, Ying);  Zhou, D (Zhou, Dong)
  |  收藏  |  浏览/下载：26/0  |  提交时间：2021/10/14
TID Response and Radiation-Enhanced Hot-Carrier Degradation in 65-nm nMOSFETs: Concerns on the Layout-Dependent Effects 期刊论文  OAI收割
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021, 卷号: 68, 期号: 8, 页码: 1565-1570
作者:  Ren, ZX (Ren, Zhexuan);  1An, X (An, Xia) 1;  Li, GS (Li, Gensong) 1;  Liu, JY (Liu, Jingyi) 1;  Xun, MZ (Xun, Mingzhu) 2
  |  收藏  |  浏览/下载：22/0  |  提交时间：2021/09/22
Altered Response to Total Body Irradiation of C57BL/6-Tg (CAG-EGFP) Mice 期刊论文  OAI收割
DOSE-RESPONSE, 2020, 卷号: 18, 期号: 3, 页码: 11
作者:  Liu, Cuihua;  Tanaka, Kaoru;  Katsube, Takanori;  Vares, Guillaume;  Maruyama, Kouichi
  |  收藏  |  浏览/下载：20/0  |  提交时间：2021/12/15
Study of the influence of gamma irradiation on long-term reliability of SiC MOSFET 期刊论文  OAI收割
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2020, 卷号: 175, 期号: 5-6, 页码: 559-566
作者:  Liang, XW (Liang, Xiaowen)[ 1,2,3 ];  Cui, JW (Cui, Jiangwei)[ 1,2 ];  Zheng, QW (Zheng, Qiwen)[ 1,2 ];  Zhao, JH (Zhao, Jinghao)[ 1,2,3 ];  Yu, XF (Yu, Xuefeng)[ 1,2 ]
  |  收藏  |  浏览/下载：17/0  |  提交时间：2020/12/11
The influence of channel width on total ionizing dose responses of the 130 nm H-gate partially depleted SOI NMOSFETs 期刊论文  OAI收割
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2020, 卷号: 175, 期号: 5-6, 页码: 551-558
作者:  Xi, SX (Xi, Shan-Xue)[ 1,2,3 ];  Zheng, QW (Zheng, Qi-Wen)[ 1,2 ];  Lu, W (Lu, Wu)[ 1,2 ];  Cui, JW (Cui, Jiang-Wei)[ 1,2 ];  Wei, Y (Wei, Ying)[ 1,2 ]
  |  收藏  |  浏览/下载：14/0  |  提交时间：2020/07/06