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中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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浏览/检索结果: 共4条,第1-4条 帮助

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Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating inp wafers 期刊论文  iSwitch采集
Materials science and engineering b-solid state materials for advanced technology, 2002, 卷号: 91, 页码: 521-524
作者:  
Zhao, YW;  Sun, NF;  Dong, HW;  Jiao, JH;  Zhao, JQ
收藏  |  浏览/下载:35/0  |  提交时间:2019/05/12
Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers 期刊论文  OAI收割
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2002, 卷号: 91, 页码: 521-524
作者:  
Zhao, YW;  Sun, NF;  Dong, HW;  Jiao, JH;  Zhao, JQ
  |  收藏  |  浏览/下载:13/0  |  提交时间:2021/02/02
Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers 会议论文  OAI收割
9th international conference on defects: recognition, imaging and physics in semiconductors (drip ix), rimini, italy, sep 24-28, 2001
Zhao YW; Sun NF; Dong HW; Jiao JH; Zhao JQ; Sun TN; Lin LY
收藏  |  浏览/下载:34/0  |  提交时间:2010/11/15
Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers 期刊论文  OAI收割
materials science and engineering b-solid state materials for advanced technology, 2002, 卷号: 91, 期号: 0, 页码: 521-524
Zhao YW; Sun NF; Dong HW; Jiao JH; Zhao JQ; Sun TN; Lin LY
收藏  |  浏览/下载:92/19  |  提交时间:2010/08/12
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