中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
金属研究所 [9]
物理研究所 [1]
武汉病毒研究所 [1]
采集方式
OAI收割 [10]
iSwitch采集 [1]
内容类型
期刊论文 [11]
发表日期
2018 [1]
2016 [1]
2014 [1]
2011 [1]
2010 [1]
2009 [1]
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学科主题
Microscopy [1]
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Autographa californica multiple nucleopolyhedrovirus enters host cells via clathrin-mediated endocytosis and direct fusion with the plasma membrane
期刊论文
iSwitch采集
Viruses-basel, 2018, 卷号: 10, 期号: 11, 页码: 17
作者:
Qin, Fujun
;
Xu, Congrui
;
Lei, Chengfeng
;
Hu, Jia
;
Sun, Xiulian
收藏
  |  
浏览/下载:112/0
  |  
提交时间:2019/05/08
Acmnpv
Single-virus tracking
Quantitative electron microscopy
Clathrin-mediated endocytosis
Direct fusion with the plasma membrane
Direct measurement of precipitate induced strain in an Al-Zn-Mg-Cu alloy with aberration corrected transmission electron microscopy
期刊论文
OAI收割
MICRON, 2016, 卷号: 90, 页码: 18-22
Ying, XR
;
Du, YX
;
Song, M
;
Lu, N
;
Ye, HQ
收藏
  |  
浏览/下载:202/0
  |  
提交时间:2016/12/28
Aberration corrected electron microscopy
Quantitative electron microscopy
Strain analysis
Precipitates
Aluminum alloys
Study of Point Spread in the Aberration-Corrected Transmission Electron Microscopy
期刊论文
OAI收割
MICROSCOPY AND MICROANALYSIS, 2014, 卷号: 20, 期号: 5, 页码: 1447
Ge, BH
;
Wang, YM
;
Chang, YJ
;
Yao, Y
收藏
  |  
浏览/下载:23/0
  |  
提交时间:2015/04/14
point spread
peak width
aberration-corrected transmission electron microscopy
quantitative electron microscopy
negative C-s imaging
positive C-s imaging
Quantifying the Microstructures of Pure Cu Subjected to Dynamic Plastic Deformation at Cryogenic Temperature
期刊论文
OAI收割
Journal of Materials Science & Technology, 2011, 卷号: 27, 期号: 8, 页码: 673-679
F. Yan
;
H. W. Zhang
;
N. R. Tao
;
K. Lu
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2012/04/13
Quantitative structural characterization
Cu
Dynamic plastic
deformation
Transmission electron microscopy
Convergent beam electron
diffraction
channel angular extrusion
fine grained copper
ultra-high strains
mechanical-properties
thermal-stability
rate sensitivity
stored
energy
evolution
strength
size
Expansion of interatomic distances in platinum catalyst nanoparticles
期刊论文
OAI收割
Acta Materialia, 2010, 卷号: 58, 期号: 3, 页码: 836-845
K. Du
;
F. Emst
;
M. C. Pelsozy
;
J. Barthel
;
K. Tillmann
收藏
  |  
浏览/下载:96/0
  |  
提交时间:2012/04/13
Nanoparticles
Catalysts
Atomistic structure
Quantitative
high-resolution transmission electron microscopy
Spherical-aberration-adjusted transmission electron microscopy
transmission electron-micrographs
pt-co electrocatalysts
oxygen
reduction
spherical-aberration
lattice-parameters
atomic-resolution
materials science
surface-tension
hrem images
in-situ
On the accuracy of maximum entropy reconstruction of high-resolution Z-contrast STEM images
期刊论文
OAI收割
Micron, 2009, 卷号: 40, 期号: 2, 页码: 247-254
X. H. Sang
;
K. Du
;
M. J. Zhuo
;
H. Q. Ye
收藏
  |  
浏览/下载:27/0
  |  
提交时间:2012/04/13
Scanning transmission electron microscopy
High-angle annular dark-field
image (HAADF)
Image processing
Quantitative electron microscopy
transmission electron-microscopy
dark-field images
grain-boundaries
adf stem
chemistry
silicon
Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the [0(1)over-bar10] orientation
期刊论文
OAI收割
JOURNAL OF MICROSCOPY, 2008, 卷号: 232, 期号: 1, 页码: 137-144
作者:
Du, K.
;
Ruehle, M.
  |  
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2021/02/02
high-resolution transmission electron microscopy
image simulation
quantitative electron microscopy
sapphire
Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the 0(1)over-bar10 orientation
期刊论文
OAI收割
Journal of Microscopy, 2008, 卷号: 232, 期号: 1, 页码: 137-144
K. Du
;
M. Ruhle
收藏
  |  
浏览/下载:19/0
  |  
提交时间:2012/04/13
high-resolution transmission electron microscopy
image simulation
quantitative electron microscopy
sapphire
crystal defect structures
hrem images
interfaces
hrtem
retrieval
alpha-al2o3
microscopy
evolution
package
films
Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram
期刊论文
OAI收割
MICRON, 2006, 卷号: 37, 期号: 1, 页码: 67-72
作者:
Du, K
;
Wang, YM
;
Lichte, H
;
Ye, HQ
  |  
收藏
  |  
浏览/下载:15/0
  |  
提交时间:2021/02/02
electron holography
high-resolution transmission electron microscopy
quantitative electron microscopy
Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram
期刊论文
OAI收割
MICRON, 2006, 卷号: 37, 期号: 1, 页码: 67-72
作者:
Du, K
;
Wang, YM
;
Lichte, H
;
Ye, HQ
  |  
收藏
  |  
浏览/下载:12/0
  |  
提交时间:2021/02/02
electron holography
high-resolution transmission electron microscopy
quantitative electron microscopy