中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
首页
机构
成果
学者
登录
注册
登陆
×
验证码:
换一张
忘记密码?
记住我
×
校外用户登录
CAS IR Grid
机构
半导体研究所 [11]
物理研究所 [2]
长春光学精密机械与物... [2]
兰州化学物理研究所 [2]
金属研究所 [1]
上海微系统与信息技术... [1]
更多
采集方式
OAI收割 [18]
iSwitch采集 [2]
内容类型
期刊论文 [18]
会议论文 [2]
发表日期
2016 [1]
2014 [1]
2011 [1]
2009 [2]
2007 [1]
2006 [4]
更多
学科主题
半导体材料 [5]
半导体物理 [5]
材料科学与物理化学 [2]
Physics, F... [1]
筛选
浏览/检索结果:
共20条,第1-10条
帮助
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
题名升序
题名降序
提交时间升序
提交时间降序
作者升序
作者降序
发表日期升序
发表日期降序
Properties of a-C:H:Si thin films deposited by middle-frequency magnetron sputtering
期刊论文
OAI收割
Applied Surface Science, 2016, 卷号: 379, 页码: 516-522
作者:
Jiang JL(姜金龙)
;
Wang, Yubao
;
Du, Jinfang
;
Yang, Hua
;
Hao JY(郝俊英)
收藏
  |  
浏览/下载:44/0
  |  
提交时间:2016/07/11
a-C:H:Si films
Magnetron sputtering
Structure
Tribological properties
Low temperature magnetron sputtering deposition of hydrogenated microcrystalline silicon thin films without amorphous incubation layers on glass
期刊论文
OAI收割
Journal of Non-Crystalline Solids, 2014, 卷号: 388, 页码: 86-90
作者:
Wang, Linqing
;
Wang, Weiyan
;
Huang, Jinhua
;
Zeng, Yuheng
;
Tan, Ruiqin
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2015/10/26
mu c-Si:H thin films
Magnetron sputtering
Amorphous incubation layers
Low temperature
Improvement of amorphous silicon n-i-p solar cells by incorporating double-layer hydrogenated nanocrystalline silicon structure
期刊论文
OAI收割
journal of non-crystalline solids, 2011, 卷号: 357, 期号: 1, 页码: 121-125
作者:
Wang C
收藏
  |  
浏览/下载:86/3
  |  
提交时间:2011/07/05
Hydrogenated nanocrystalline silicon
Buffer layer
i/p interface
Solar cells
OPEN-CIRCUIT VOLTAGE
A-SI-H
P/I-INTERFACE
MICROCRYSTALLINE SILICON
VAPOR-DEPOSITION
FILMS
CAPACITANCE
EFFICIENCY
CRYSTALLINE
TEMPERATURE
Effects of Substrate Temperature on the Growth of Polycrystalline Si Films Deposited with SiH(4)+Ar
期刊论文
OAI收割
Journal of Materials Science & Technology, 2009, 卷号: 25, 期号: 4, 页码: 489-491
H. Cheng
;
A. M. Wu
;
J. Q. Xiao
;
N. L. Shi
;
L. S. Wen
收藏
  |  
浏览/下载:24/0
  |  
提交时间:2012/04/13
Poly-Si films
ECR-PECVD
Substrate temperature
Ar-dilution
chemical-vapor-deposition
ar-diluted sih4
microcrystalline silicon
optical-properties
h films
plasma
pecvd
hydrogen
silane
Smooth Surface Morphology of Hydrogenated Amorphous Silicon Film Prepared by Plasma Enhanced Chemical Vapor Deposition
期刊论文
OAI收割
PLASMA SCIENCE & TECHNOLOGY, 2009, 卷号: 11, 期号: 5, 页码: 569-575
Yan, X
;
Feng, F
;
Zhang, J
;
Wang, YL
收藏
  |  
浏览/下载:21/0
  |  
提交时间:2012/03/24
A-SI-H
THIN-FILMS
ION-BOMBARDMENT
LOW-TEMPERATURE
SILANE PLASMA
GROWTH
PECVD
DIFFUSION
ROUGHNESS
FREQUENCY
The effect of N/Si ratio on the a-SiiH/SiNx interface of a-SirH/SiNx TFT (EI CONFERENCE)
会议论文
OAI收割
Asia Display 2007, AD'07, March 12, 2007 - March 16, 2007, Shanghai, China
Liu J. e.
;
Gao W.
;
Liao Y.
;
Jing H.
;
Fu G.
收藏
  |  
浏览/下载:24/0
  |  
提交时间:2013/03/25
The threshold voltage of a-Si: H/SiNx TFT will shift under long time gate bias stress
it is mostly leaded by charge trapping in gate insulator and defect creation in semiconductor. And it is hard to be applied in AMOLED for TFT because of its threshold voltage shift. In allusion to the phenomenon of charge trapping
a series of SiNx insulating films in different N/Si(0. 87 -1.68) ratio were deposited by PECVD in this paper
controlling different flow ratio of source gas SiH4 and NH3
and a great deal of tests (ellipsometer
infrared absorption (FTIR) and Electron Dispersion Spectrum (EDS) test ) were done on these samples. Based on these SiNx insulators
three different capacitance samples in MIS structure were done
degraded experiments and C-V tests on these samples were done. The C-V curve shift of capacitance which contained SiNx with slightly N-rich(N/Si is bigger slightly than 1. 33) was not evident before and after degradation
this result indicated that the defect density of this type SiN x was smaller
and could restrain charge chapping in the interface of a-Si:H/SiNx effectively. So that as gate insulator of TFT
SiN x with slightly N-rich could decrease the threshold voltage shift of TFT and enhance its stability effectively.
Nanocrystalline silicon films with high conductivity and the application for pin solar cells
期刊论文
iSwitch采集
Vacuum, 2006, 卷号: 81, 期号: 1, 页码: 126-128
作者:
Cui Min
;
Zhang Weija
;
Wang Tianmin
;
Jin Fei
;
Li Guohua
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2019/05/12
Nc-si : h
Conductivity
Pecvd
Films
Solar cells
Properties of n-type mu c-si : h films by cat-cvd for c-si heterojunction solar cells
期刊论文
iSwitch采集
Thin solid films, 2006, 卷号: 501, 期号: 1-2, 页码: 141-143
作者:
Zhang, Q
;
Zhu, M
;
Liu, F
;
Liu, J
收藏
  |  
浏览/下载:27/0
  |  
提交时间:2019/05/10
Hwcvd
N-type mu c-si : h films
Heterojunction solar cells
Temperature-enhanced ultraviolet emission in ZnO thin film (EI CONFERENCE)
会议论文
OAI收割
Zhang Y. J.
;
Xu C. S.
;
Liu Y. C.
;
Liu Y. X.
;
Wang G. R.
;
Fan X. W.
收藏
  |  
浏览/下载:27/0
  |  
提交时间:2013/03/25
We have studied the structural and optical properties of ZnO thin films prepared by thermal oxidation of ZnS films deposited by plasma assisted electron-beam evaporation on Si(1 0 0) substrates. The transformation from zinc blende ZnS to hexagonal wurtzite ZnO is confirmed by Raman and X-ray diffraction (XRD) measurement. For the sample thermally oxidized at 600 C for 2 h
a novel UV emission peak Ix located at 3.22 eV (385 nm) has been observed. The temperature-dependent photoluminescence spectra show that the integrated intensity of Ix increases exponentially with increasing temperatures within the measuring temperature range
from 80 to 300 K
but the peak position remains nearly constant. We explain this behavior in terms of electron tunneling into the radiative recombination centers.
Nanocrystalline silicon films with high conductivity and the application for PIN solar cells
期刊论文
OAI收割
vacuum, 2006, 卷号: 81, 期号: 1, 页码: 126-128
Min C (Cui Min)
;
Zhang WJ (Zhang Weija)
;
Wang TM (Wang Tianmin)
;
Jin F (Jin Fei)
;
Li GH (Li Guohua)
;
Ding K (Ding Kun)
收藏
  |  
浏览/下载:41/0
  |  
提交时间:2010/04/11
nc-Si : H
conductivity
PECVD
films
solar cells