中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
半导体研究所 [4]
采集方式
OAI收割 [4]
内容类型
会议论文 [2]
期刊论文 [2]
发表日期
2006 [3]
2005 [1]
学科主题
半导体材料 [3]
半导体物理 [1]
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共4条,第1-4条
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Recent research results on deep level defects in semi-insulating InP - Application to improve material quality
会议论文
OAI收割
12th international conference on indium phosphide and related materials, princeton, nj, may 07-11, 2006
Zhao, YW (Zhao, Youwen)
;
Dong, ZY (Dong, Zhiyuan)
;
Dong, HW (Dong, Hongwei)
;
Sun, NF (Sun, Niefeng)
;
Sun, TN (Sun, Tongnian)
收藏
  |  
浏览/下载:66/12
  |  
提交时间:2010/03/29
STIMULATED CURRENT SPECTROSCOPY
CURRENT TRANSIENT SPECTROSCOPY
FE-DOPED INP
POINT-DEFECTS
COMPENSATION
TEMPERATURE
DONORS
TRAPS
Growth of high quality semi-insulating InP single crystal by suppression of compensation defects
期刊论文
OAI收割
journal of rare earths, 2006, 卷号: 24, 期号: sp.iss.si, 页码: 75-77
Zhao YW
;
Dong ZY
;
Duan ML
;
Sun WR
;
Yang ZX
收藏
  |  
浏览/下载:46/0
  |  
提交时间:2010/04/11
indium phosphide
defect
semi-insualting
STIMULATED CURRENT SPECTROSCOPY
CURRENT TRANSIENT SPECTROSCOPY
SEMI-INSULATING INP
DEEP-LEVEL DEFECTS
FE
Electron irradiation-induced defects in InP pre-annealed at high temperature
期刊论文
OAI收割
materials science in semiconductor processing, 2006, 卷号: 9, 期号: 1-3, 页码: 380-383
Zhao YW (Zhao Y. W.)
;
Dong ZY (Dong Z. Y.)
;
Deng AH (Deng A. H.)
收藏
  |  
浏览/下载:51/0
  |  
提交时间:2010/04/11
indium phosphide
defect
irradiation
THERMALLY STIMULATED CURRENT
UNDOPED SEMIINSULATING INP
DEEP-LEVEL DEFECTS
FRENKEL PAIRS
FE
SPECTROSCOPY
PHOSPHIDE
AMBIENT
TRAPS
Improvement of the electrical property of semi-insulating InP by suppression of compensation defects
会议论文
OAI收割
17th international conference on indium phosphide and related materials, glasgow, scotland, may 08-12, 2005
Zhao, YW
;
Dong, ZY
收藏
  |  
浏览/下载:234/68
  |  
提交时间:2010/03/29
ENCAPSULATED CZOCHRALSKI INP
SEMICONDUCTOR COMPOUND-CRYSTALS
STIMULATED CURRENT SPECTROSCOPY
CURRENT TRANSIENT SPECTROSCOPY
DEEP-LEVEL DEFECTS
ANNEALING AMBIENT
POINT-DEFECTS
FE
PHOSPHIDE
DONORS