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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
近代物理研究所 [4]
金属研究所 [2]
新疆理化技术研究所 [2]
武汉物理与数学研究所 [2]
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OAI收割 [19]
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期刊论文 [18]
会议论文 [1]
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2019 [1]
2018 [2]
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2011 [2]
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Physics [2]
Engineerin... [1]
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A stochastic multi-scale thermal conductivity numerical model for 2D C/SiC-Ti
3
SiC
2
composite
期刊论文
OAI收割
MECHANICS OF ADVANCED MATERIALS AND STRUCTURES, 2024, 页码: 17
作者:
Ma T(马特)
;
Wang RX(王睿星)
;
Yuan W(袁武)
;
Jia, Xiaodong
;
Song HW(宋宏伟)
  |  
收藏
  |  
浏览/下载:18/0
  |  
提交时间:2024/08/12
2D C/SiC-Ti3SiC2 composite
stochastic multi-scale model
thermal conductivity
temperature field
laser irradiation experiment
Electronic transport in MoSe2 FETs modified by latent tracks created by swift heavy ion irradiation
期刊论文
OAI收割
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2019, 卷号: 52, 页码: 125102
作者:
Zhang, S. X.
;
Liu, J.
;
Zeng, J.
;
Hu, P. P.
;
Maaz, K.
  |  
收藏
  |  
浏览/下载:67/0
  |  
提交时间:2019/04/02
molybdenum selenide
field-effect transistor
electronic transportation
swift heavy ion irradiation
latent track
The gold nanoparticle springs' spectrum modulation
期刊论文
OAI收割
MATERIALS RESEARCH EXPRESS, 2018, 卷号: 5, 期号: 11, 页码: 10
作者:
Wang, Zhenyu
;
Ouyang, Xinrong
;
Liu, Jing
;
Xiong, Bin
;
Wen, Xiaodong
  |  
收藏
  |  
浏览/下载:190/0
  |  
提交时间:2019/05/23
gold nanoparticles spring
spectrum modulation
LSPR
large angle laser irradiation dark field observation
SiC ceramics joined with an in-situ reaction gradient layer of TiC/Ti(3)SiC(2 )and interface stress distribution simulations
期刊论文
OAI收割
CERAMICS INTERNATIONAL, 2018, 卷号: 44, 期号: 13, 页码: 15785-15794
作者:
Huang, Qing
;
Ding, Shurong
;
Lee, Jaehyung
;
Li, Peng
;
Li, Youbing
  |  
收藏
  |  
浏览/下载:45/0
  |  
提交时间:2018/12/04
Ti3sic2 Tape Film
Sintering Technique
Matrix Composites
High-temperature
Fiber
Field
Ti
Microstructure
Irradiation
Interlayer
Synthesis and characterization of pi-extended thienoacenes with up to 13 fused aromatic rings
期刊论文
OAI收割
TETRAHEDRON LETTERS, 2014, 卷号: 55, 期号: 41, 页码: 5663-5666
作者:
Shao, Jing
;
Zhao, Xiaoli
;
Wang, Li
;
Tang, Qingxin
;
Li, Weili
  |  
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2019/04/09
Thienoacenes
Intramolecular Cyclizations
Microwave Irradiation
Organic Field-effect Transistors
Effects of X-ray irradiation on the structure and field electron emission properties of vertically aligned few-layer graphene
期刊论文
OAI收割
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2013, 卷号: 304, 期号: 1, 页码: 49-56
作者:
Wu, JQ
;
Zhang, Y
;
Wang, 王波;伊福廷
;
B
;
Yi, FT
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2016/04/08
Few-layer graphene
X-ray irradiation
Field emission
Theorical model of enhanced low dose rate sensitivity observed in p-type metal-oxide-semiconductor field-effect transistor
期刊论文
OAI收割
ACTA PHYSICA SINICA, 2011, 卷号: 60, 期号: 6
作者:
Gao Bo
;
Yu Xue-Feng
;
Ren Di-Yuan
;
Cui Jiang-Wei
;
Lan Bo
收藏
  |  
浏览/下载:49/0
  |  
提交时间:2012/11/29
p-type metal-oxide-semiconductor field-effect transistor
Co-60 gamma-ray
total-dose irradiation damage effects
enhanced low dose rate sensitivity
p型金属氧化物半导体场效应晶体管低剂量率辐射损伤增强效应模型研究
期刊论文
OAI收割
物理学报, 2011, 卷号: 60, 期号: 6, 页码: 812-818
作者:
高博
;
余学峰
;
任迪远
;
崔江维
;
兰博
收藏
  |  
浏览/下载:27/0
  |  
提交时间:2012/11/29
p-type metal-oxide-semiconductor field-effect transistor
60Co gamma-ray
total-dose irradiation damage effects
enhanced low dose rate sensitivity
Selective removal of metallic single-walled carbon nanotubes by combined in situ and post-synthesis oxidation
期刊论文
OAI收割
Carbon, 2010, 卷号: 48, 期号: 10, 页码: 2941-2947
B. Yu
;
P. X. Hou
;
F. Li
;
B. L. Liu
;
C. Liu
;
H. M. Cheng
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2012/04/13
field-effect transistors
preferential destruction
absorption-spectroscopy
fluorescence
irradiation
separation
Total ionizing dose effects and annealing behavior for domestic VDMOS devices
期刊论文
OAI收割
Journal of Semiconductors, 2010, 卷号: 31, 期号: 4
Gao
;
Yu
;
Ren
;
Liu
;
Wang
;
Sun
;
Cui
;
Bo1
;
Xuefeng1
;
Diyuan1
;
Gang3
;
Yiyuan1
;
Jing1
;
Jiangwei1
;
2
;
2
;
2
;
2
;
2
;
2
;
4
;
4
;
4
收藏
  |  
浏览/下载:18/0
  |  
提交时间:2011/08/19
Drain current - Electric breakdown - Experiments - Field effect transistors - Ionizing radiation - Irradiation - Radiation effects - Threshold voltage - Annealing behavior - Annealing time - Bias conditions - Breakdown voltage - Drain bias voltage - Electrical parameter - N-channel - On-state resistance - Preirradiation - Total dose - Total dose effect - Total ionizing dose effects - VDMOS device - VDMOS devices