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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
半导体研究所 [8]
长春光学精密机械与物... [3]
金属研究所 [1]
苏州纳米技术与纳米仿... [1]
中国科学院大学 [1]
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OAI收割 [10]
iSwitch采集 [4]
内容类型
期刊论文 [10]
会议论文 [4]
发表日期
2015 [1]
2013 [1]
2007 [2]
2006 [3]
2005 [1]
2004 [1]
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学科主题
半导体材料 [5]
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Characterization of Leakage and Reliability of SiNx Gate Dielectric by Low-Pressure Chemical Vapor Deposition for GaN-based MIS-HEMTs
期刊论文
OAI收割
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2015, 卷号: 62, 期号: 10, 页码: 8
作者:
Hua, MY
;
Liu, C
;
Yang, S
;
Liu, SH
;
Fu, K
收藏
  |  
浏览/下载:38/0
  |  
提交时间:2015/12/31
Gallium nitride
gate dielectric
low-pressure chemical vapor deposition (LPCVD)
silicon nitride
Response spectrum 0.9-2.65 m of In0.82Ga0.18As detectors by two-step growth technique (EI CONFERENCE)
会议论文
OAI收割
2012 International Conference on Material Sciences and Manufacturing Technology, ICMSMT 2012, October 5, 2012 - October 6, 2012, Dalian, China
作者:
Zhang T.
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  |  
浏览/下载:33/0
  |  
提交时间:2013/03/25
InP/In0.82Ga0.18As/InP heterostructure used for infrared detector were grown on (100) S-doped InP substrates using two-step growth technique by low temperature metal-organic chemical vapor deposition. The growth was performed using TMIn
TMGa
AsH3
and PH3 as growth precursors in a horizontal reactor. The substrates on a graphite susceptor were heated by inductively coupling RF power
their temperatures were detected by a thermocouple
and the reactor pressure was kept at 10000 Pa. The growth structure of detector included In0.82Ga0.18As buffer with the thickness of 100 nm
In0.82Ga0.18As absorption layer with the thickness of 2.8 m
and the InP cap with the thickness of 0.8 m. The planar type of p-i-n detector was fabricated by Zn diffusion. The properties of In0.82Ga0.18As detector were studied
the curves of the I-V characteristics
the range of response spectrum
and the detectivity (D*) were obtained. (2013) Trans Tech Publications
Switzerland.
Preferential orientation growth of ain thin films on si (111) substrates by lp-mocvd
期刊论文
iSwitch采集
Modern physics letters b, 2007, 卷号: 21, 期号: 22, 页码: 1437-1445
作者:
Zhao, Yongmei
;
Sun, Guosheng
;
Liu, Xingfang
;
Li, Jiaye
;
Zhao, Wanshun
收藏
  |  
浏览/下载:34/0
  |  
提交时间:2019/05/12
Aluminum nitride
Low pressure metalorganic chemical vapor deposition (lp-mocvd)
V/iii ratio
Preferential orientation growth mechanism
Preferential orientation growth of AIN thin films on Si (111) substrates by LP-MOCVD
期刊论文
OAI收割
modern physics letters b, 2007, 卷号: 21, 期号: 22, 页码: 1437-1445
Zhao, YM
;
Sun, GS
;
Liu, XF
;
Li, JY
;
Zhao, WS
;
Wang, L
;
Luo, MC
;
Li, JM
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  |  
浏览/下载:51/0
  |  
提交时间:2010/03/08
aluminum nitride
low pressure metalorganic chemical vapor deposition (LP-MOCVD)
V/III ratio
preferential orientation growth mechanism
High-quality multiple quantum wells selectively grown with tapered masks by ultra-low-pressure mocvd
期刊论文
iSwitch采集
Optical materials, 2006, 卷号: 28, 期号: 8-9, 页码: 1037-1040
作者:
Zhao, Q
;
Pan, JQ
;
Zhang, J
;
Wang, W
收藏
  |  
浏览/下载:27/0
  |  
提交时间:2019/05/12
Selective-area growth
Ultra-low-pressure
Metal-organic chemical vapor deposition
Tapered mask
Photoluminescence
Low threshold field electron emission of diamond films (EI CONFERENCE)
会议论文
OAI收割
ICO20: Display Devices and Systems, August 21, 2005 - August 26, 2005, Changchun, China
作者:
Liu L.
;
Wang W.
;
Wang W.
;
Li M.
;
Liu L.
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  |  
浏览/下载:20/0
  |  
提交时间:2013/03/25
Since CVD diamond film possesses desirable properties
it has been widely investigated
and much research has been made in this field. In this experiment
we mainly studied the characteristics of field emission from the CVD diamond films. The motivation for the experiment is to gain some insight into a possible emission mechanism. The diamond films are grown using a hot filament chemical vapor deposition
basing on the diamond micro-grits on silicon substrates. And the diamond micro-grits are deposited on silicon substrates using electrophoresis coat method
through a solution of diamond micro-grits in ethyl alcohol. This study has revealed that emission can be obtained at fields as low as 1.8V/m. And the field emission measurements were carried out at a pressure of 10-4Pa.
High-quality multiple quantum wells selectively grown with tapered masks by ultra-low-pressure MOCVD
期刊论文
OAI收割
optical materials, 2006, 卷号: 28, 期号: 8-9, 页码: 1037-1040
作者:
Pan JQ
收藏
  |  
浏览/下载:71/0
  |  
提交时间:2010/04/11
selective-area growth
ultra-low-pressure
metal-organic chemical vapor deposition
tapered mask
photoluminescence
BANDGAP ENERGY CONTROL
INTEGRATED DFB LASER
EPITAXY
Formation and characteristics of quantum dots of wide band gap II-VI semiconductor (EI CONFERENCE)
会议论文
OAI收割
Fifth International Conference on Thin Film Physics and Applications, May 31, 2004 - June 2, 2004, Shanghai, China
Fan X. W.
;
Shan C. X.
;
Yang Y.
;
Zhang J. Y.
;
Liu Y. C.
;
Lu Y. M.
;
Shen D. Z.
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2013/03/25
CdSe and ZnCdSe quantum dots (QDs) were grown under Stranski-Krastanow (S-K) mode by low-pressure metalorganic chemical vapor deposition (LP-MOCVD). The formation process of CdSe QDs below critical thickness was observed by atomic force microscopy (AFM). The formation mechanism of CdSe QDs below the critical thickness was due to the effect of surface diffusion and strain release. ZnCdSe QDs were grown based on the calculated critical thickness. Two kinds of variations in the ZnCdSe QDs appeared over time
the Ostwald ripening process and dot formation process. ZnSeS dots were grown under Volmer-Weber (V-W) mode. With increasing the growth duration
the size of dots becomes larger and the density decreases
which is explained by virtue of the surface free energy.
Study of photoluminescence spectra of si-rich sinx films
期刊论文
iSwitch采集
Materials letters, 2004, 卷号: 58, 期号: 19, 页码: 2397-2400
作者:
Liu, YZ
;
Zhou, YQ
;
Shi, WQ
;
Zhao, LL
;
Sun, BY
收藏
  |  
浏览/下载:27/0
  |  
提交时间:2019/05/10
Photolumineseence
Rapid thermal annealing (rta)
Low pressure chemical vapor deposition (lpcvd)
Silicon nitride
Thin films
Optical materials and properties
Strain accommodation of 3c-sic grown on hydrogen-implanted si (001) substrate
期刊论文
iSwitch采集
Journal of crystal growth, 2003, 卷号: 257, 期号: 3-4, 页码: 321-325
作者:
Zhang, ZC
;
Chen, YH
;
Li, DB
;
Zhang, FQ
;
Yang, SY
收藏
  |  
浏览/下载:24/0
  |  
提交时间:2019/05/12
Substrate
Heteroepitaxy
Low pressure chemical vapor deposition
Semiconducting silicon carbide