机构

• 近代物理研究所 [14]
• 国家空间科学中心 [1]
• 新疆理化技术研究所 [1]
• 中国科学院大学 [1]
• 合肥物质科学研究院 [1]

采集方式

• OAI收割 [17]
• iSwitch采集 [1]

内容类型

• 期刊论文 [15]
• 会议论文 [3]

发表日期

• 2020 [1]
• 2019 [2]
• 2018 [1]
• 2017 [1]
• 2016 [4]
• 2015 [2]
• 更多

学科主题

筛选

浏览/检索结果: 共18条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Research on the Single Event Effect of CCD Analog Front-end for Satellite-borne directional polarization camera 会议论文  OAI收割 Shanghai, China, 2020-10-17-2020-10-20 作者:  Ping-ping Yao;  Zhengyu Zou;  Zhilong Xu;  Donggen Luo;  Jin Hong   |  收藏  |  浏览/下载：85/0  |  提交时间：2021/12/10 Directional Polarimetric Camera  CCD imaging system  Image processing  single event effects  high-energy particles  single event latch-up  heavy-ion  Analog front end   Design and verification of universal evaluation system for single event effect sensitivity measurement in very-large-scale integrated circuits 期刊论文  OAI收割 IEICE ELECTRONICS EXPRESS, 2019, 卷号: 16, 期号: 10, 页码: 6 作者:  Xu, Liewei;  Cai, Chang;  Liu, Tianqi;  Ke, Lingyun;  Yu, Jun   |  收藏  |  浏览/下载：75/0  |  提交时间：2019/11/10 FPGA  single event effects  heavy ions  irradiation   Heavy-ion and pulsed-laser single event effects in 130-nm CMOS-based thin/thick gate oxide anti-fuse PROMs 期刊论文  OAI收割 NUCLEAR SCIENCE AND TECHNIQUES, 2019, 卷号: 30, 期号: 5, 页码: 11 作者:  Zhao, Pei-Xiong;  Geng, Chao;  Zhang, Zhan-Gang;  Liu, Jie;  Li, Xiao-Yuan   |  收藏  |  浏览/下载：68/0  |  提交时间：2019/11/10 Anti-fuse PROM  Single event effects  Heavy ions  Pulsed laser  Space error rate   Synergistic effect of total ionizing dose on single event effect induced by pulsed laser microbeam on SiGe heterojunction bipolar transistor 期刊论文  OAI收割 CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 10, 页码: 1-10 作者:  Zhang, JX (Zhang, Jin-Xin)[ 1 ];  Guo, HX (Guo, Hong-Xia)[ 2,3 ];  Pan, XY (Pan, Xiao-Yu)[ 3 ];  Guo, Q (Guo, Qi)[ 2 ];  Zhang, FQ (Zhang, Feng-Qi)[ 3 ]   |  收藏  |  浏览/下载：47/0  |  提交时间：2018/11/20 Sige Hbt  Synergistic Effect  Single Event Effects  Total Ionizing Dose   Prediction of proton-induced SEE error rates for the VATA160 ASIC 期刊论文  OAI收割 NUCLEAR SCIENCE AND TECHNIQUES, 2017, 卷号: 28, 页码: 6 作者:  Xi, Kai;  Jiang, Di;  Gao, Shan-Shan;  Kong, Jie;  Zhao, Hong-Yun   |  收藏  |  浏览/下载：24/0  |  提交时间：2018/05/31 Proton  ASIC  Single event effects  Error rates   Monte Carlo predictions of proton SEE cross-sections from heavy ion test data 期刊论文  OAI收割 CHINESE PHYSICS C, 2016, 卷号: 40, 页码: 47-52 作者:  Xi, Kai;  Geng, Chao;  Zhang, Zhan-Gang;  Hou, Ming-Dong;  Sun, You-Mei   |  收藏  |  浏览/下载：19/0  |  提交时间：2018/05/31 single event effects  Geant4  protons  heavy ions   Implementation and verification of different ECC mitigation designs for BRAMs in flash-based FPGAs 期刊论文  OAI收割 CHINESE PHYSICS C, 2016, 卷号: 40, 页码: 9 作者:  Yang, Zhen-Lei;  Wang, Xiao-Hui;  Zhang, Zhan-Gang;  Liu, Jie;  Su, Hong   |  收藏  |  浏览/下载：18/0  |  提交时间：2018/05/31 single event effects  flash-based FPGAs  BRAMs  error correcting codes  Hamming codes  BCH codes   Experimental study on heavy ion single-event effects in flash-based FPGAs 期刊论文  OAI收割 NUCLEAR SCIENCE AND TECHNIQUES, 2016, 卷号: 27, 页码: 8 作者:  Liu, Tian-Qi;  Yang, Zhen-Lei;  Liu, Jie;  Wang, Xiao-Hui;  Su, Hong   |  收藏  |  浏览/下载：22/0  |  提交时间：2018/05/31 Single-event effects (SEEs)  Flash-based FPGAs  HIRFL  Heavy ion experiments   Single event effect hardness for the front-end ASICs in the DAMPE satellite BGO calorimeter 期刊论文  OAI收割 CHINESE PHYSICS C, 2016, 卷号: 40, 页码: 6 作者:  Gao, Shan-Shan;  Jiang, Di;  Feng, Chang-Qing;  Xi, Kai;  Liu, Shu-Bin   |  收藏  |  浏览/下载：29/0  |  提交时间：2018/05/31 space electronics  single event effects  radiation hardness  heavy ion  pulsed laser   A flexible and robust soft-error testing system for microelectronic devices and integrated circuits 期刊论文  OAI收割 NUCLEAR SCIENCE AND TECHNIQUES, 2015, 卷号: 26, 页码: 7 作者:  Gu Song;  Su Hong;  Liu Jie;  Zhang Zhan-Gang;  Tong Teng   |  收藏  |  浏览/下载：36/0  |  提交时间：2018/05/31 SEE testing  Testing system  Single Event Effects  Soft errors  HIRFL