机构

• 近代物理研究所 [14]
• 国家空间科学中心 [1]
• 新疆理化技术研究所 [1]
• 中国科学院大学 [1]
• 合肥物质科学研究院 [1]

采集方式

• OAI收割 [17]
• iSwitch采集 [1]

内容类型

• 期刊论文 [15]
• 会议论文 [3]

发表日期

• 2020 [1]
• 2019 [2]
• 2018 [1]
• 2017 [1]
• 2016 [4]
• 2015 [2]
• 更多

学科主题

筛选

浏览/检索结果: 共18条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序发表日期升序发表日期降序题名升序题名降序作者升序作者降序 Research on the Single Event Effect of CCD Analog Front-end for Satellite-borne directional polarization camera 会议论文  OAI收割 Shanghai, China, 2020-10-17-2020-10-20 作者:  Ping-ping Yao;  Zhengyu Zou;  Zhilong Xu;  Donggen Luo;  Jin Hong   |  收藏  |   Design and verification of universal evaluation system for single event effect sensitivity measurement in very-large-scale integrated circuits 期刊论文  OAI收割 IEICE ELECTRONICS EXPRESS, 2019, 卷号: 16, 期号: 10, 页码: 6 作者:  Xu, Liewei;  Cai, Chang;  Liu, Tianqi;  Ke, Lingyun;  Yu, Jun   |  收藏  |   Heavy-ion and pulsed-laser single event effects in 130-nm CMOS-based thin/thick gate oxide anti-fuse PROMs 期刊论文  OAI收割 NUCLEAR SCIENCE AND TECHNIQUES, 2019, 卷号: 30, 期号: 5, 页码: 11 作者:  Zhao, Pei-Xiong;  Geng, Chao;  Zhang, Zhan-Gang;  Liu, Jie;  Li, Xiao-Yuan   |  收藏  |   Synergistic effect of total ionizing dose on single event effect induced by pulsed laser microbeam on SiGe heterojunction bipolar transistor 期刊论文  OAI收割 CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 10, 页码: 1-10 作者:  Zhang, JX (Zhang, Jin-Xin)[ 1 ];  Guo, HX (Guo, Hong-Xia)[ 2,3 ];  Pan, XY (Pan, Xiao-Yu)[ 3 ];  Guo, Q (Guo, Qi)[ 2 ];  Zhang, FQ (Zhang, Feng-Qi)[ 3 ]   |  收藏  |   Prediction of proton-induced SEE error rates for the VATA160 ASIC 期刊论文  OAI收割 NUCLEAR SCIENCE AND TECHNIQUES, 2017, 卷号: 28, 页码: 6 作者:  Xi, Kai;  Jiang, Di;  Gao, Shan-Shan;  Kong, Jie;  Zhao, Hong-Yun   |  收藏  |   Monte Carlo predictions of proton SEE cross-sections from heavy ion test data 期刊论文  OAI收割 CHINESE PHYSICS C, 2016, 卷号: 40, 页码: 47-52 作者:  Xi, Kai;  Geng, Chao;  Zhang, Zhan-Gang;  Hou, Ming-Dong;  Sun, You-Mei   |  收藏  |   Implementation and verification of different ECC mitigation designs for BRAMs in flash-based FPGAs 期刊论文  OAI收割 CHINESE PHYSICS C, 2016, 卷号: 40, 页码: 9 作者:  Yang, Zhen-Lei;  Wang, Xiao-Hui;  Zhang, Zhan-Gang;  Liu, Jie;  Su, Hong   |  收藏  |   Experimental study on heavy ion single-event effects in flash-based FPGAs 期刊论文  OAI收割 NUCLEAR SCIENCE AND TECHNIQUES, 2016, 卷号: 27, 页码: 8 作者:  Liu, Tian-Qi   |  收藏  |   Single event effect hardness for the front-end ASICs in the DAMPE satellite BGO calorimeter 期刊论文  OAI收割 CHINESE PHYSICS C, 2016, 卷号: 40, 页码: 6 作者:  Gao, Shan-Shan;  Jiang, Di;  Feng, Chang-Qing;  Xi, Kai;  Liu, Shu-Bin   |  收藏  |   A flexible and robust soft-error testing system for microelectronic devices and integrated circuits 期刊论文  OAI收割 NUCLEAR SCIENCE AND TECHNIQUES, 2015, 卷号: 26, 页码: 7 作者:  Gu Song;  Su Hong;  Liu Jie;  Zhang Zhan-Gang;  Tong Teng   |  收藏  |