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	Microstructure of FeCrAl Thin Film Composed of Nanocrystals Deposited on Zr Alloy and Their Corrosion Behavior Under Water Steam Atmosphere 期刊论文 OAI收割 JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2019, 卷号: 19, 期号: 5, 页码: 2732-2737 作者: Cui, Yong; Liang, Zhiyuan; Wang, Gang; Li, Changji; Li, Jing \| 收藏 \| 浏览/下载：16/0 \| 提交时间：2021/02/02 FeCrAl Thin Film Al2O3 Passivation Layer High Temperature Water Steam Atmosphere Corrosion Property
	Effects of HfO2 Interlayer on Microstructure and Mechanical Property of Al2O3 Thin Film on MgF2 Substrate 期刊论文 OAI收割 JOURNAL OF INORGANIC MATERIALS, 2016, 卷号: 31, 期号: 7, 页码: 779-784 作者: Song Bo; Zhao Li-Li; Chen Xiao-Ying; You Li-Jun; Song Li-Xin 收藏 \| 浏览/下载：25/0 \| 提交时间：2017/02/27 HfO2 interlayer Al2O3 thin film microstructure mechanical properties MgF2 substrate
	Preparation and characterization of a ZrO2-TiO2-co-doped Na-beta ''-Al2O3 ceramic thin film 期刊论文 OAI收割 CERAMICS INTERNATIONAL, 2016, 卷号: 42, 期号: 7, 页码: 8990-8996 作者: Zhao, K.; Liu, Y.; Zeng, S. M.; Yang, J. H.; Liu, Y. W. 收藏 \| 浏览/下载：30/0 \| 提交时间：2017/02/27 Tape casting Na-beta ''-Al2O3 Thin film ZrO2-TiO2-co-doping
	Optical characteristic of ion beam sputter deposited aluminum thin films (EI CONFERENCE) 会议论文 OAI收割 International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China 作者: Yang H.; Liu L.; Liu L. 收藏 \| 浏览/下载：28/0 \| 提交时间：2013/03/25 Aluminum is a typical active metal very easy to oxidize. An oxide surface layer of about 2-6nm quickly formed in air which adds difficulty to the optical constants determination. An ex-situ method is used to determine the optical constants of aluminum thin films. First Second Third alumina (Al2O3) thin film is deposited by ion beam sputter deposition. The optical constants and thickness are determined by spectral ellipsoemtry (SE). The thickness is verified by grazing x-ray reflection (GXRR) fitting method Al thin film with an Al2O3 cap layer on top is deposited. This cap layer is of the same deposition condition with the first step. By fitting the GXRR spectra based on the acquired structure information the structure information (the thickness of the aluminum and the cap layer the ellipsometric spectra are fitted. The optical constants of the aluminum layer are extracted with the aid of the Drude model. Finally surface roughness and the diffusion between Al-Al2O 3) is obtained an induced transmission filter (ITF) is designed and deposited.
	4H-SiC基底Al_2O_3/SiO_2双层减反射膜的设计和制备期刊论文 OAI收割光学学报, 2008, 卷号: 28, 期号: 12, 页码: 2431, 2435 黄火林; 张峰; 吴正云; 齐红基; 姚建可; 范正修; 邵建达收藏 \| 浏览/下载：1196/189 \| 提交时间：2009/09/22 薄膜光学 Al2O3/SiO2双层减反射膜电子束蒸发 4H-SiC基底折射率 4H-SiC substrate Al2O3/SiO2 double-layer anti-reflection coatings Deposited layers Electron beam evaporation Layer coatings Layer thicknesses Physical thicknesses Reference wavelengths Reflection spectrums Scanning electron microscopes SEM images Single layers Thin film optics UV optoelectronic devices Wavelength selectivities
	Thermal decomposition of Mo(CO)(6) on thin Al2O3 film: A combinatorial investigation by XPS and UPS 期刊论文 OAI收割 surface science, 2007, 卷号: 601, 期号: 3, 页码: 844-851 作者: Jiang, Zhiquan; Huang, Weixin; Zhang, Zhen; Zhao, Hong; Tan, Dali 收藏 \| 浏览/下载：25/0 \| 提交时间：2015/11/11 molybdenum hexacarbonyl thin Al2O3 film thermal decomposition X-ray photoelectron spectroscopy ultraviolet photoelectron spectroscopy
	Influence of sol-gel derived Al2O3 film on the oxidation behavior of a Ti3Al based alloy 期刊论文 OAI收割 Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing, 2006, 卷号: 415, 期号: 1-2, 页码: 177-183 M. Zhu; M. S. Li; Y. L. Li; Y. C. Zhou 收藏 \| 浏览/下载：19/0 \| 提交时间：2012/04/14 Ti3Al based alloy sol-gel processing Al2O3 thin film high-temperature oxidation titanium aluminides resistance coatings improvement air
	Characterization of ZnO/Mg0.12Zn0.88O heterostructure grown by plasma-assisted molecular beam epitaxy (EI CONFERENCE) 会议论文 OAI收割 13th International Conference on Molecular Beam Epitaxy, August 22, 2004 - August 27, 2004, 13th International Conference on Molecular Beam Epitaxy, August 22, 2004 - August 27, 2004 Lu Y. M.; Wu C. X.; Wei Z. P.; Zhang Z. Z.; Zhao D. X.; Zhang J. Y.; Liu Y. C.; Shen D. Z.; Fan X. W. 收藏 \| 浏览/下载：28/0 \| 提交时间：2013/03/25 In this paper Mg0.12Zn0.88O/ZnO heterostructures were fabricated on c-plane sapphire (Al2O3) substrates by plasma-assisted molecular beam epitaxy (P-MBE). The quality of the Mg 0.12Zn0.88O alloy thin film was characterized by X-ray diffraction (XRD) and reflection high-energy electron diffraction (RHEED). Optical properties of the Mg0.12Zn0.88O/ZnO heterostructure were studied by absorption and photoluminescence (PL) spectra. At room temperature (RT) Mg0.12Zn0.88O/ZnO heterostructures show two absorption edges originating from ZnO and Mg 0.12Zn0.88O layers respectively. In PL spectra two ultraviolet emission bands related to the ZnO layer and the Mg 0.12Zn0.88O layer were observed. The emission band from Mg0.12Zn0.88O layer dominates at moderately lower temperature and the luminescence of ZnO becomes gradually important with increasing temperature. This is suggested to exist as a potential barrier in the interface and to restrict the relaxation of the carriers from the Mg 0.12Zn0.88O layer to ZnO layer. As the thickness of ZnO layer decreases the emission from the Mg0.12Zn0.88O layer becomes weaker and weaker. When the ZnO thickness is up to 2 nm only the luminescence of the ZnO layer is observed at RT. The quenching of the emission corresponding to the MgZnO layer indicates the existence of a strong injection process in the samples with thinner ZnO layer. 2005 Elsevier B.V. All rights reserved.
	Study of the diffusion behaviour of MoO3 and ZnO on oxide thin films by SR-TXRF 期刊论文 OAI收割 SURFACE AND INTERFACE ANALYSIS, 2001, 卷号: 32, 期号: 1, 页码: #REF! 作者: Xu, WM; Xu, JQ; Wu, NZ; Yan, JF; Zhu, YF 收藏 \| 浏览/下载：33/0 \| 提交时间：2016/04/13 MoO3 ZnO Al2O3 TiO2 SiO2 thin film SR-TXRF