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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
半导体研究所 [11]
采集方式
OAI收割 [11]
内容类型
期刊论文 [10]
会议论文 [1]
发表日期
2010 [1]
2009 [1]
2002 [1]
2001 [3]
1999 [1]
1998 [3]
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学科主题
半导体物理 [11]
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学科主题:半导体物理
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First-principles study of ground-state properties and high pressure behavior of ThO2
期刊论文
OAI收割
journal of nuclear materials, JOURNAL OF NUCLEAR MATERIALS, 2010, 2010, 卷号: 399, 399, 期号: 2-3, 页码: 181-188, 181-188
作者:
Wang BT (Wang Bao-Tian)
;
Shi HL (Shi Hongliang)
;
Li WD (Li Wei-Dong)
;
Zhang P (Zhang Ping)
;
Zhang, P, Inst Appl Phys & Computat Math, LCP, POB 8009, Beijing 100088, Peoples R China. 电子邮箱地址: zhang_ping@iapcm.ac.cn
  |  
收藏
  |  
浏览/下载:34/0
  |  
提交时间:2010/06/18
ELASTIC PROPERTIES
Elastic Properties
Actinide Dioxides
Thorium-dioxide
Single-crystal
Stability
ACTINIDE DIOXIDES
THORIUM-DIOXIDE
SINGLE-CRYSTAL
STABILITY
Magnetic coupling properties of rare-earth metals (Gd, Nd) doped ZnO: First-principles calculations
期刊论文
OAI收割
journal of applied physics, 2009, 卷号: 106, 期号: 2, 页码: art. no. 023910
Shi HL
;
Zhang P
;
Li SS
;
Xia JB
收藏
  |  
浏览/下载:106/25
  |  
提交时间:2010/03/08
FERROMAGNETIC SEMICONDUCTOR
BAND-STRUCTURE
STABILIZATION
INJECTION
Thermal annealing behaviour of Ni/Au on n-GaN Schottky contacts
期刊论文
OAI收割
journal of physics d-applied physics, 2002, 卷号: 35, 期号: 20, 页码: 2648-2651
作者:
Zhang SM
;
Zhao DG
收藏
  |  
浏览/下载:59/0
  |  
提交时间:2010/08/12
RESISTANCE OHMIC CONTACTS
FIELD-EFFECT TRANSISTOR
SINGLE-CRYSTAL GAN
MICROWAVE PERFORMANCE
STABILITY
BARRIER
DIODES
Surface roughness and high density of cubic twins and hexagonal inclusions in cubic GaN epilayers
期刊论文
OAI收割
science in china series a-mathematics physics astronomy, 2001, 卷号: 44, 期号: 6, 页码: 796-800
Qu B
;
Li SF
;
Hu GX
;
Zheng XH
;
Wang YT
;
Lin SM
;
Yang H
;
Liang JW
收藏
  |  
浏览/下载:88/3
  |  
提交时间:2010/08/12
GaN
polarity
surface roughness
FILMS
STABILITY
GROWTH
Multiplicity factor and diffraction geometry factor for single crystal X-ray diffraction analysis and measurement of phase content in cubic GaN/GaAs(001) epilayers
期刊论文
OAI收割
science in china series a-mathematics physics astronomy, 2001, 卷号: 44, 期号: 4, 页码: 497-503
Qu B
;
Zheng XH
;
Wang YT
;
Feng ZH
;
Han JY
;
Liu S
;
Lin SM
;
Yang H
;
Liang JW
收藏
  |  
浏览/下载:106/6
  |  
提交时间:2010/08/12
four-circle diffraction
GaN
phase content
MOLECULAR-BEAM EPITAXY
GAN FILMS
GROWTH
STABILITY
RATIO
Gap states of hydrogenated amorphous silicon near and above the threshold of microcrystallinity with subtle boron compensation
期刊论文
OAI收割
applied physics letters, 2001, 卷号: 78, 期号: 17, 页码: 2509-2511
Sheng SR
;
Liao XB
;
Kong GL
收藏
  |  
浏览/下载:103/17
  |  
提交时间:2010/08/12
CONSTANT PHOTOCURRENT METHOD
A-SI-H
ABSORPTION
FILMS
SPECTROSCOPY
DEPOSITION
STABILITY
DILUTION
A comparison of photoluminescence properties of InGaAs GaAs quantum dots with a single quantum well
期刊论文
OAI收割
journal of applied physics, 1999, 卷号: 86, 期号: 3, 页码: 1456-1459
Kong MY
;
Wang XL
;
Pan D
;
Zeng YP
;
Wang J
;
Ge WK
收藏
  |  
浏览/下载:48/0
  |  
提交时间:2010/08/12
OPTICAL-PROPERTIES
CARRIER RELAXATION
THERMAL-ACTIVATION
LOCALIZED EXCITONS
SUPERLATTICES
MULTILAYERS
STABILITY
ISLANDS
GROWTH
Stability improvement of selective oxidation during the fabrication of InGaAs/GaAs vertical cavity surface emitting laser
期刊论文
OAI收割
japanese journal of applied physics part 1-regular papers short notes & review papers, 1998, 卷号: 37, 期号: 6b, 页码: 3673-3675
Pan Z
;
Zhang Y
;
Du Y
;
Wu RH
收藏
  |  
浏览/下载:31/0
  |  
提交时间:2010/08/12
VCSEL
selective oxidation
stability
MICROSTRUCTURE
WET OXIDATION
Stability improvement of selective oxidation during the fabrication of InGaAs/GaAs vertical cavity surface emitting laser
会议论文
OAI收割
6th microoptics conference / 14th topical meeting on gradient-index optical systems (moc/grin 97), tokyo, japan, oct 07-09, 1997
Pan Z
;
Zhang Y
;
Du Y
;
Wu RH
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2010/11/15
VCSEL
selective oxidation
stability
WET OXIDATION
MICROSTRUCTURE
Structural study of YSi1.7 layers formed by channeled ion beam synthesis
期刊论文
OAI收割
journal of vacuum science & technology b, 1998, 卷号: 16, 期号: 4, 页码: 1901-1906
Wu MF
;
Yao SD
;
Vantomme A
;
Hogg S
;
Pattyn H
;
Langouche G
;
Yang QQ
;
Wang QM
收藏
  |  
浏览/下载:26/0
  |  
提交时间:2010/08/12
YTTRIUM-SILICIDE LAYERS
ERSI1.7 LAYERS
COSI2 LAYERS
THIN-FILMS
IMPLANTATION
SI
DIFFRACTION
STABILITY
KINETICS
SI(111)