机构

• 新疆理化技术研究所 [35]

采集方式

• OAI收割 [35]

内容类型

• 期刊论文 [35]

发表日期

• 2021 [1]
• 2020 [2]
• 2019 [2]
• 2018 [6]
• 2016 [2]
• 2014 [2]
• 更多

学科主题

• Engineerin... [4]
• Physics [2]

筛选

浏览/检索结果: 共35条，第1-10条 帮助 限定条件 专题：新疆理化技术研究所    第一署名单位    第一作者单位    通讯作者单位     条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序发表日期升序发表日期降序题名升序题名降序作者升序作者降序 Influence of enhanced low dose rate sensitivity on single-event transient degradation in the LM158 bipolar operational amplifier 期刊论文  OAI收割 AIP ADVANCES, 2021, 卷号: 11, 期号: 5, 页码: 1-6 作者:  Xiang, CAF (Xiang, Chuanfeng) 1 , 2;  Yao, S (Yao, Shuai) 1 , 3;  Lu, W (Lu, Wu) 1 , 2;  Li, XL (Li, Xiaolong) 1;  Yu, X (Yu, Xin) 1   |  收藏  |  浏览/下载：50/0  |  提交时间：2021/08/06 Displacement damage effects induced by fast neutron in backside-illuminated CMOS image sensors 期刊论文  OAI收割 JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2020, 卷号: 57, 期号: 9, 页码: 1015-1021 作者:  Zhang, X (Zhang, Xiang)[ 1,2,3 ];  Li, YD (Li, Yudong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ]   |  收藏  |  浏览/下载：12/0  |  提交时间：2020/12/09 14-MeV neutron  neutron irradiation  radiation damage  radiation effect   A study of hot pixels induced by proton and neutron irradiations in charge coupled devices 期刊论文  OAI收割 RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2020, 卷号: 175, 期号: 5-6, 页码: 540-550 作者:  Liu, BK (Liu, Bingkai)[ 1,2,3 ];  Li, YD (Li, Yudong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ]   |  收藏  |  浏览/下载：25/0  |  提交时间：2020/07/06 Charge coupled devices (CCDs)  proton irradiation  neutron irradiation  hot pixels  displacement damage effects   Synergistic effect of enhanced low-dose-rate sensitivity and single event transient in bipolar voltage comparator LM139 期刊论文  OAI收割 JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2019, 卷号: 56, 期号: 2, 页码: 172-178 作者:  Yao, S (Yao, Shuai)[ 1,2,3 ];  Lu, W (Lu, Wu)[ 1,2,4 ];  Yu, X (Yu, Xin)[ 1,2 ];  Wang, X (Wang, Xin)[ 1,2 ];  Li, XL (Li, Xiaolong)[ 1,2,3 ]   |  收藏  |  浏览/下载：80/0  |  提交时间：2019/02/25 Enhanced low dose rate sensitivity  single event transient  bipolar voltage comparator  synergistic effect   Comparison of holes trapping and protons transport induced by low dose rate gamma radiation in oxide on different SiGe processes 期刊论文  OAI收割 MICROELECTRONICS RELIABILITY, 2019, 卷号: 103, 期号: 12, 页码: 1-5 作者:  Li, P (Li, Pei)[ 1 ];  He, CH (He, ChaoHui)[ 1 ];  Guo, HX (Guo, HongXia)[ 2,3 ];  Zhang, JX (Zhang, JinXin)[ 4 ];  Li, YH (Li, YongHong)[ 1 ]   |  收藏  |  浏览/下载：33/0  |  提交时间：2020/01/10 SiGe HBTs  Oxide isolation  ELDRS  EHPs generation  Holes trapping  Protons transportation   Estimation of low-dose-rate degradation on bipolar linear circuits using different accelerated evaluation methods 期刊论文  OAI收割 ACTA PHYSICA SINICA, 2018, 卷号: 67, 期号: 9, 页码: 202-209 作者:  Li, XL (Li Xiao-Long)[ 1,2,3 ];  Lu, W (Lu Wu)[ 1,2 ];  Wang, X (Wang Xin)[ 1,2,3 ];  Guo, Q (Guo Qi)[ 1,2 ];  He, CF (He Cheng-Fa)[ 1,2 ]   |  收藏  |  浏览/下载：35/0  |  提交时间：2018/09/27 Bipolar Circuit  Enhanced Low-dose-rate Sensitivity  Accelerated Evaluation Method   Radiation Effects Due to 3 MeV Proton Irradiations on Back-Side Illuminated CMOS Image Sensors 期刊论文  OAI收割 CHINESE PHYSICS LETTERS, 2018, 卷号: 35, 期号: 7, 页码: 1-4 作者:  Zhang, X (Zhang, Xiang);  Li, YD (Li, Yu-Dong);  Wen, L (Wen, Lin);  Zhou, D (Zhou, Dong);  Feng, J (Feng, Jie)   |  收藏  |  浏览/下载：31/0  |  提交时间：2018/08/14 Estimation of enhanced low dose rate sensitivity mechanisms using temperature switching irradiation on gate-controlled lateral PNP transistor 期刊论文  OAI收割 CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 3, 页码: 1-9 作者:  Li, XL (Li, Xiao-Long);  Lu, W (Lu, Wu);  Wang, X (Wang, Xin);  Yu, X (Yu, Xin);  Guo, Q (Guo, Qi)   |  收藏  |  浏览/下载：22/0  |  提交时间：2018/05/14 Ionizing Radiation Damage  Enhanced Low Dose Rate Sensitivity (Eldrs)  Switched Temperature Irradiation  Gate-controlled Lateral Pnp Transistor (glPnp)   Using temperature-switching approach to evaluate the ELDRS of bipolar devices 期刊论文  OAI收割 RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2018, 卷号: 172, 期号: 11-12, 页码: 824-834 作者:  Li, XL (Li, Xiaolong);  Lu, W (Lu, Wu);  Wang, X (Wang, Xin);  Guo, Q (Guo, Qi);  Yu, X (Yu, Xin)   |  收藏  |  浏览/下载：29/0  |  提交时间：2018/07/24 Bipolar Technology  Co-60 Gamma Irradiation  Enhanced Low-dose Rate Sensitivity (Eldrs)  Temperature-switching Approach (Tsa)   Study of Total-Ionizing-Dose Effects on a Single-Event-Hardened Phase-Locked Loop 期刊论文  OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 期号: 4, 页码: 997-1004 作者:  Chen, ZJ (Chen, Zhuojun);  Ding, D (Ding, Ding);  Dong, YM (Dong, Yemin);  Shan, Y (Shan, Yi);  Zhou, SX (Zhou, Shuxing)   |  收藏  |  浏览/下载：35/0  |  提交时间：2018/05/07 Phase-locked Loop (Pll)  Phase Noise  Reference Spur  Total Ionizing Dose (Tid)