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Chinese Academy of Sciences Institutional Repositories Grid
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Influence of electron irradiation on hydrothermally grown zinc oxide single crystals 期刊论文  iSwitch采集
Semiconductor science and technology, 2008, 卷号: 23, 期号: 9, 页码: 6
作者:  
Lu, L. W.;  So, C. K.;  Zhu, C. Y.;  Gu, Q. L.;  Li, C. J.
收藏  |  浏览/下载:23/0  |  提交时间:2019/05/12
Annihilation of deep level defects in inp through high temperature annealing 期刊论文  iSwitch采集
Journal of physics and chemistry of solids, 2008, 卷号: 69, 期号: 2-3, 页码: 551-554
作者:  
Zhao, Y. W.;  Dong, Z. Y.
收藏  |  浏览/下载:20/0  |  提交时间:2019/05/12
Defect  
Thermally induced fe atom transition from substitutional to interstitial sites in inp and its influence on material property 期刊论文  iSwitch采集
Acta physica sinica, 2007, 卷号: 56, 期号: 9, 页码: 5536-5541
作者:  
Zhao You-Wen;  Miao Shan-Shan;  Dong Zhi-Yuan;  Lue Xiao-Hong;  Deng Ai-Hong
收藏  |  浏览/下载:15/0  |  提交时间:2019/05/12
Influence of deep level defects on electrical compensation in semi-insulating inp materials 期刊论文  iSwitch采集
Acta physica sinica, 2007, 卷号: 56, 期号: 2, 页码: 1167-1171
作者:  
Yang Jun;  Zhao You-Wen;  Dong Zhi-Yuan;  Deng Ai-Hong;  Miao Shan-Shan
收藏  |  浏览/下载:18/0  |  提交时间:2019/05/12
Origin of deep level defect related photoluminescence in annealed inp 期刊论文  iSwitch采集
Journal of applied physics, 2006, 卷号: 100, 期号: 12, 页码: 4
作者:  
Zhao, Youwen;  Dong, Zhiyuan;  Miao, Shanshan;  Deng, Aihong;  Yang, Jun
收藏  |  浏览/下载:14/0  |  提交时间:2019/05/12
Growth and characterization of semi-insulating gan films grown by mocvd 期刊论文  iSwitch采集
Journal of rare earths, 2006, 卷号: 24, 页码: 14-18
作者:  
Fang, CB;  Wang, XL;  Hu, GX;  Wang, JX;  Wang, CM
收藏  |  浏览/下载:19/0  |  提交时间:2019/05/12
Mocvd  Gan  Resistivity  Tsc  
Growth of high quality semi-insulating inp single crystal by suppression of compensation defects 期刊论文  iSwitch采集
Journal of rare earths, 2006, 卷号: 24, 页码: 75-77
作者:  
Zhao, YW;  Dong, ZY;  Duan, ML;  Sun, WR
收藏  |  浏览/下载:15/0  |  提交时间:2019/05/12
Electron irradiation-induced defects in inp pre-annealed at high temperature 期刊论文  iSwitch采集
Materials science in semiconductor processing, 2006, 卷号: 9, 期号: 1-3, 页码: 380-383
作者:  
Zhao, Y. W.;  Dong, Z. Y.;  Deng, A. H.
收藏  |  浏览/下载:16/0  |  提交时间:2019/05/12
Development of current-based microscopic defect analysis method using optical filling techniques for the defect study on heavily irradiated high-resistivity si sensors/detectors 期刊论文  iSwitch采集
Materials science in semiconductor processing, 2006, 卷号: 9, 期号: 1-3, 页码: 283-287
作者:  
Li, Z.;  Li, C. J.
收藏  |  浏览/下载:18/0  |  提交时间:2019/05/12
Annealing ambient controlled deep defect formation in inp 期刊论文  iSwitch采集
European physical journal-applied physics, 2004, 卷号: 27, 期号: 1-3, 页码: 167-169
作者:  
Zhao, YW;  Dong, ZY;  Duan, ML;  Sun, WR;  Zeng, YP
收藏  |  浏览/下载:15/0  |  提交时间:2019/05/12