中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
机构
  • 微电子研究所 [4]
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发表日期
  • 2015 [4]
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A Physical Model for the Statistics of the Set Switching Time of Resistive RAM Measured with the Width-Adjusting Pulse Operation Method 期刊论文  OAI收割
IEEE Electron Device Letters, 2015
作者:  
Zhang MY(张美芸);  Yu ZA(余兆安);  Li Y(李阳);  Xu DL(许定林);  Lv HB(吕杭炳)
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Investigation of TaN as the wet etch stop layer for HKMG-last integration in the 22 nm and beyond nodes CMOS technology 期刊论文  OAI收割
Vacuum, 2015
作者:  
Cui HS(崔虎山);  Luo J(罗军);  Xu J(许静);  Gao JF(高建峰);  Xiang JJ(项金娟)
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Improving resistance uniformity and endurance of resistive switching memory by accurately controlling the stress time of pulse program operation 期刊论文  OAI收割
Appl. Phys. Lett., 2015
作者:  
Xu DL(许定林);  Wang GM(王国明);  Long SB(龙世兵);  Yu ZA(余兆安);  Zhang MY(张美芸)
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Impact of program/erase operation on the performances of oxide-based resistive switching memory 期刊论文  OAI收割
Nanoscale Research Letters, 2015
作者:  
Wang GM(王国明);  Long SB(龙世兵);  Yu ZA(余兆安);  Zhang MY(张美芸);  Li Y(李阳)
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