机构

• 光电技术研究所 [21]

采集方式

• OAI收割 [21]

内容类型

• 期刊论文 [20]
• 会议论文 [1]

发表日期

• 2018 [2]
• 2017 [3]
• 2016 [4]
• 2015 [2]
• 2013 [4]
• 2012 [2]
• 更多

学科主题

筛选

浏览/检索结果: 共21条，第1-10条 帮助 限定条件 专题：光电技术研究所    第一署名单位    第一作者单位    通讯作者单位     条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序发表日期升序发表日期降序题名升序题名降序作者升序作者降序 Chip-Integrated Geometric Metasurface As a Novel Platform for Directional Coupling and Polarization Sorting by Spin-Orbit Interaction 期刊论文  OAI收割 IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2018, 卷号: 24, 期号: 6, 页码: 4700107 作者:  Guo, Yinghui;  Pu, Mingbo;  Li, Xiong;  Ma, Xiaoliang;  Song, Shichao   |  收藏  |  浏览/下载：46/0  |  提交时间：2019/08/23 Directional coupling  geometric phase  gradient phase  integrated optical waveguide  metasurfaces  optical nanoantennas  silicon-on-insulator  spin-orbit interaction  subwavelength structures  surface plasmonics   Ultra-broadband spin-controlled directional router based on single optical catenary integrated on silicon waveguide 期刊论文  OAI收割 APPLIED PHYSICS EXPRESS, 2018, 卷号: 11, 期号: 9, 页码: 92202 作者:  Guo, Yinghui;  Pu, Mingbo;  Li, Xiong   |  收藏  |  浏览/下载：21/0  |  提交时间：2019/08/23 Overhead lines  Polarization  Silicon  Ultra-wideband (UWB)   SiNx thickness dependence of spectral properties and durability of protected-silver mirrors 期刊论文  OAI收割 Surface and Coatings Technology, 2017, 卷号: 324, 页码: 175-181 作者:  Xu, Xu;  He, Wenyan;  Wang, Changjun;  Wei, Ming;  Li, Bincheng   |  收藏  |  浏览/下载：23/0  |  提交时间：2018/11/20 Corrosion - Corrosion resistance - Environmental testing - Mirrors - Protective coatings - Reflection - Scanning electron microscopy - Silicon nitride - Silver   Characterization of surface defects of silicon substrates by the total scattering and absorption 会议论文  OAI收割 作者:  Zhang, Kepeng;  Zhang, Xingxin;  Huang, Wei   |  收藏  |  浏览/下载：33/0  |  提交时间：2018/12/20 Absorption - Atomic force microscopy - Brillouin scattering - Light scattering - Microscopes - Optical systems - Photonics - Reflection - Silicon - Substrates - Surface roughness - Surface scattering   Origins of a damage-induced green photoluminescence band in fused silica revealed by time-resolved photoluminescence spectroscopy 期刊论文  OAI收割 Optical Materials Express, 2017, 卷号: 7, 期号: 8, 页码: 295821 作者:  Zhou, Jiangning;  Li, Bincheng   |  收藏  |  浏览/下载：15/0  |  提交时间：2018/11/20 Excimer lasers - Laser damage - Laser excitation - Photoluminescence - Photoluminescence spectroscopy - Silica - Silicon - Surface defects   Photocarrier Radiometry Investigation of Light-Induced Degradation of Boron-Doped Czochralski-Grown Silicon Without Surface Passivation 期刊论文  OAI收割 INTERNATIONAL JOURNAL OF THERMOPHYSICS, 2016, 卷号: 37, 期号: 4 作者:  Wang, Qian;  Li, Bincheng 收藏  |  浏览/下载：15/0  |  提交时间：2016/06/27 B-O defect  Light-induced degradation  Photocarrier radiometry  Silicon  Surface state   The effect of the surface energy and structure of the SiC substrate on epitaxial graphene growth 期刊论文  OAI收割 RSC Advances, 2016, 卷号: 6, 期号: 103, 页码: 100908-100915 作者:  Sun, Li;  Chen, Xiufang;  Yu, Wancheng;  Sun, Honggang;  Zhao, Xian   |  收藏  |  浏览/下载：16/0  |  提交时间：2018/06/14 Atomic Force Microscopy  Interfacial Energy  Microelectronics  Silicon  Silicon Carbide   Thermo-optic Imbert-Fedorov effect in a prism-waveguide coupling system with silicon-on-insulator 期刊论文  OAI收割 OPTICS COMMUNICATIONS, 2016, 卷号: 370, 页码: 49-54 作者:  Tang, Tingting;  Li, Chaoyang;  Luo, Li;  Zhang, Yanfen;  Yuan, Quan   |  收藏  |  浏览/下载：17/0  |  提交时间：2018/06/14 Imbert-fedorov Shift  Thermo-optic Effect  Silicon-on-insulator   Influence of deposition parameters on residual stress of YbF3 thin film 期刊论文  OAI收割 Proceedings of SPIE: Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015, 2016, 卷号: 9796, 页码: 97960N 作者:  Zhang, Yao-Ping;  Fan, Jun-Qi;  Long, Guo-Yun   |  收藏  |  浏览/下载：15/0  |  提交时间：2018/06/14 Adaptive Optics  Coatings  Deposition  Ion Beam Assisted depositIon  Monocrystalline Silicon  Reflective Coatings  Refractive Index  Residual Stresses  Space Debris  Sputtering   Combined Frequency- and Time-Domain Photocarrier Radiometry Characterization for Annealing Temperature Dependence of Arsenic Ion-Implanted Silicon Wafers 期刊论文  OAI收割 INTERNATIONAL JOURNAL OF THERMOPHYSICS, 2015, 卷号: 36, 期号: 5-6, 页码: 1045-1050 作者:  Ren, Shengdong;  Li, Bincheng;  Wang, Qian 收藏  |  浏览/下载：22/0  |  提交时间：2015/09/21 Carrier effective lifetime  Photocarrier radiometry  Silicon  Thermal annealing