机构

• 近代物理研究所 [11]
• 自动化研究所 [3]
• 上海药物研究所 [1]
• 新疆理化技术研究所 [1]
• 心理研究所 [1]
• 微电子研究所 [1]
• 更多

采集方式

• OAI收割 [19]

内容类型

• 期刊论文 [15]
• 会议论文 [4]

发表日期

• 2024 [3]
• 2023 [1]
• 2021 [3]
• 2020 [1]
• 2018 [2]
• 2017 [4]
• 更多

学科主题

筛选

浏览/检索结果: 共19条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 TA-denseNet: Efficient hardware trust and assurance model based on feature extraction and comparison of SEM images and GDSII images 期刊论文  OAI收割 INTEGRATION-THE VLSI JOURNAL, 2024, 卷号: 95, 页码: 9 作者:  Xiao, Wei;  Zhao, Fazhan;  Zhao, Kun;  Ma, Hongtu;  Li, Qing   |  收藏  |  浏览/下载：28/0  |  提交时间：2024/02/20 Scanning electron microscopy  Deep learning  Hardware trust and assurance  Integrated circuit   Powerful-IoU: More straightforward and faster bounding box regression loss with a nonmonotonic focusing mechanism 期刊论文  OAI收割 NEURAL NETWORKS, 2024, 卷号: 170, 页码: 276-284 作者:  Liu, Can;  Wang, Kaige;  Li, Qing;  Zhao, Fazhan;  Zhao, Kun   |  收藏  |  浏览/下载：59/0  |  提交时间：2024/02/22 Object detection  Bounding box regression  Loss function design  Focusing mechanism   Novel methods for locating and matching IC cells based on standard cell libraries 期刊论文  OAI收割 MICROELECTRONIC ENGINEERING, 2024, 卷号: 283, 页码: 12 作者:  Liu, Can;  Wang, Kaige;  Li, Qing;  Zhao, Fazhan;  Zhao, Kun   |  收藏  |  浏览/下载：25/0  |  提交时间：2024/02/22 Reverse engineering  Integrated circuits  Scanning electron microscopy  Image processing  Hardware security   Peptide-functionalized therapeutic nanoplatform for treatment orthotopic triple negative breast cancer and bone metastasis 期刊论文  OAI收割 NANOMEDICINE-NANOTECHNOLOGY BIOLOGY AND MEDICINE, 2023, 卷号: 50, 页码: 102669 作者:  Li, Daifeng;  Ma, Shengnan;  Xu, Denghui;  Meng, Xiaocao;  Lei, Ningjing   |  收藏  |  浏览/下载：17/0  |  提交时间：2024/03/27 Triple-negative breast cancer  Epidermal growth factor receptor  Peptide-functionalized therapy  Peptide self-assembly  Nanoplatform   Engineering and Microscopic Mechanism of Quantum Emitters Induced by Heavy Ions in hBN 期刊论文  OAI收割 ACS PHOTONICS, 2021, 卷号: 8, 期号: 10, 页码: 2912-2922 作者:  Gu, Rui;  Wang, Lei;  Zhu, Huiping;  Han, Shuangping;  Bai, Yurong   |  收藏  |  浏览/下载：37/0  |  提交时间：2021/12/13 heavy ion irradiation  hBN  quantum emitters  PL mapping  production efficiency  point defects   Radiation effects of heavy ions on the static and dynamic characteristics of 850 nm high-speed vertical cavity surface emitting lasers 期刊论文  OAI收割 JOURNAL OF LUMINESCENCE, 2021, 卷号: 237, 页码: 7 作者:  Shan, Xiaoting;  Li, Bo;  Zhao, Fazhan;  Wang, Lei;  Sun, Yun   |  收藏  |  浏览/下载：38/0  |  提交时间：2021/12/09 VCSEL  Radiation effects  Dynamic characteristics  Quantum wells   The prevalence and related factors of metabolic syndrome in outpatients with first-episode drug-naive major depression comorbid with anxiety 期刊论文  OAI收割 SCIENTIFIC REPORTS, 2021, 卷号: 11, 期号: 1, 页码: 9 作者:  Zhong, Yinghua;  Hu, Manji;  Wang, Qiang;  Yang, Zhendong;  Zhu, Na   |  收藏  |  浏览/下载：224/0  |  提交时间：2021/03/29 Comparison of X-Ray and Proton Irradiation Effects on the Characteristics of InGaN/GaN Multiple Quantum Wells Light-Emitting Diodes 期刊论文  OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2020, 卷号: 67, 期号: 7, 页码: 1345-1350 作者:  Lei Wang ;   Ningyang Liu;   Bo Li ;   Huiping Zhu;   Xiaoting Shan;   Qingxi Yuan;   Xuewen Zhang;   Zheng Gong;   Fazhan Zhao ;   Naixin Liu;   Mengxin Liu;   Binhong Li;   Jiantou Gao;   Yang Huang ;   Jianqun Yang;   Xingji Li;   Jiajun Luo;   Zhengsheng Han, and Xinyu   |  收藏  |  浏览/下载：30/0  |  提交时间：2021/06/28 The Impacts of Heavy Ion Energy on Single Event Upsets in SOI SRAMs 期刊论文  OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018 作者:  Song Gu;  Jie Liu;  Jinshun Bi;  Fazhan Zhao;  zhangang Zhang   |  收藏  |  浏览/下载：16/0  |  提交时间：2019/04/12 The Impacts of Heavy Ion Energy on Single Event Upsets in SOI SRAMs 期刊论文  OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 页码: 1091-1100 作者:  Gu, Song;  Liu, Jie;  Bi, Jinshun;  Zhao, Fazhan;  Zhang, Zhangang   |  收藏  |  浏览/下载：36/0  |  提交时间：2018/07/16 Energy dependence  heavy ions  nuclear reactions  silicon-on-insulator (SOI) technology  single event upset (SEU)