机构

• 近代物理研究所 [9]
• 高能物理研究所 [2]
• 寒区旱区环境与工程研... [1]

采集方式

• OAI收割 [10]
• iSwitch采集 [2]

内容类型

• 期刊论文 [8]
• 会议论文 [4]

发表日期

• 2019 [3]
• 2017 [5]
• 2015 [1]
• 2011 [3]

学科主题

筛选

浏览/检索结果: 共12条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Beam optics of upgraded high energy heavy ion microbeam in Lanzhou 期刊论文  OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2019, 卷号: 461, 页码: 10-15 作者:  Ponomarov, Artem;  Du, Guanghua;  Guo, Jinlong;  Liu, Wenjing;  Wu, Ruqun   |  收藏  |  浏览/下载：35/0  |  提交时间：2022/01/19 High energy heavy ion microbeam  Spatial resolution  Beam optics simulation  Cyclotron  Carbon therapy  Single event upset   Preliminary single event effect distribution investigation on 28 nm soc using heavy ion microbeam 期刊论文  iSwitch采集 Nuclear instruments & methods in physics research section b-beam interactions with materials and atoms, 2019, 卷号: 450, 页码: 323-326 作者:  Yang, Weitao;  Du, Xuecheng;  Guo, Jinlong;  Wei, Junze;  Du, Guanghua 收藏  |  浏览/下载：136/0  |  提交时间：2019/10/08 Single event effect (see)  System on chip (soc)  Heavy ion microbeam  On-chip-memory (ocm)   Preliminary single event effect distribution investigation on 28 nm SoC using heavy ion microbeam 期刊论文  OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2019, 卷号: 450, 页码: 323-326 作者:  Yang, Weitao;  Du, Xuecheng;  Guo, Jinlong;  Wei, Junze;  Du, Guanghua   |  收藏  |  浏览/下载：83/0  |  提交时间：2019/11/10 Single event effect (SEE)  System on Chip (SoC)  Heavy ion microbeam  On-chip-memory (OCM)   Application of SEU imaging for analysis of device architecture using a 25 MeV/u Kr-86 ion microbeam at HIRFL 期刊论文  OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 404, 页码: 254-258 作者:  Wang, Bin;  Liu, Tianqi;  Liu, Jie;  Yang, Zhenlei;  Guo, Jinlong   |  收藏  |  浏览/下载：34/0  |  提交时间：2018/05/31 Heavy-ion microbeam  High-energy  Single event upset  FPGA  Imaging   Application of SEU imaging for analysis of device architecture using a 25 MeV/u Kr-86 ion microbeam at HIRFL 会议论文  OAI收割 作者:  Su, Hong;  Liu, Tianqi;  Yang, Zhenlei;  Guo, Jinlong;  Du, Guanghua   |  收藏  |  浏览/下载：35/0  |  提交时间：2018/08/20 Heavy-ion microbeam  High-energy  Single event upset  FPGA  Imaging   Application of seu imaging for analysis of device architecture using a 25 mev/u kr-86 ion microbeam at hirfl 期刊论文  iSwitch采集 Nuclear instruments & methods in physics research section b-beam interactions with materials and atoms, 2017, 卷号: 404, 页码: 254-258 作者:  Liu, Tianqi;  Yang, Zhenlei;  Guo, Jinlong;  Du, Guanghua;  Tong, Teng 收藏  |  浏览/下载：101/0  |  提交时间：2019/04/23 Heavy-ion microbeam  High-energy  Single event upset  Fpga  Imaging   Application of SEU imaging for analysis of device architecture using a 25 MeV/u Kr-86 ion microbeam at HIRFL 期刊论文  OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 404, 页码: 254-258 作者:  Tong T(童腾);  Liu, J;  Ye, B;  Wang, B;  Liu, JD   |  收藏  |  浏览/下载：35/0  |  提交时间：2019/08/27 Heavy-ion microbeam  High-energy  Single event upset  FPGA  Imaging   Heavy-Ion Microbeam Fault Injection into SRAM-Based FPGA Implementations of Cryptographic Circuits 期刊论文  OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2015, 卷号: 62, 页码: 1341-1348 作者:  Shao, Cuiping;  Li, Huiyun;  Xu, Guoqing;  Guo, Jinlong;  Dai, Liang   |  收藏  |  浏览/下载：28/0  |  提交时间：2018/05/31 Cryptographic integrated circuits  fault injection  heavy ion  microbeam  single-event transient (SET)   High energy heavy ion microbeam irradiation facility at IMP 会议论文  OAI收割 作者:  Zhang, Xiaoqi;  Su, Hong;  Li, Wenjian;  Dang, Bingrong;  Sun, Youmei   |  收藏  |  浏览/下载：44/0  |  提交时间：2018/08/20 Heavy ion  High energy  Microbeam  Quadrupole lens