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• 半导体研究所 [5]
• 上海应用物理研究所 [3]
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• OAI收割 [32]
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• 2020 [1]
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• 光学薄膜 [3]
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浏览/检索结果: 共34条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 In situ GISAXS study on the temperature-dependent performance of multilayer monochromators from the liquid nitrogen cooling temperature to 600 degrees C 期刊论文  OAI收割 APPLIED SURFACE SCIENCE, 2020, 卷号: 508, 页码: - 作者:  Jiang, H;  Hua, WQ;  Tian, NX;  Li, AG;  Li, XH   |  收藏  |  浏览/下载：36/0  |  提交时间：2021/09/06 X-RAY REFLECTION  SILICON MONOCHROMATOR  ROUGHNESS  INTERFACE  GROWTH  SCATTERING  MIRRORS   Multiwavelength Regression Algorithm for Eliminating Chamber Surface Effects of Microfluidic Chips 期刊论文  OAI收割 Applied Spectroscopy, 2019, 卷号: 73, 期号: 1, 页码: 40-46 作者:  Y.Xu;  Y.H.Wu;  J.F.Wu;  M.B.Chi   |  收藏  |  浏览/下载：56/0  |  提交时间：2020/08/24 Ultraviolet-visible,UV-Vis spectrophotometry,multiwavelength linear,regression,MLR,centrifugal microfluidic chip,surface roughness,scattering,Instruments & Instrumentation,Spectroscopy   Characterizing curved surface roughness of Wolter-I X-ray grazing incidence telescope 期刊论文  OAI收割 Chinese Optics, 2019, 卷号: 12, 期号: 3, 页码: 587-595 作者:  Y.-C.Zhang;  P.Liu;  X.-G.Wang;  L.-P.He;  B.Chen   |  收藏  |  浏览/下载：26/0  |  提交时间：2020/08/24 Surface roughness,Mirrors,Power spectral density,Spectral density,Surface measurement,Surface scattering,Telescopes,X ray scattering   Method of controlling optical surface roughness based on stray light requirements 期刊论文  OAI收割 ACTA PHYSICA SINICA, 2017, 卷号: 66, 期号: 19 作者:  Song Yan-Song;  Yang Jian-Feng;  Li Fu;  Ma Xiao-Long;  Wang Hong   |  收藏  |  浏览/下载：22/0  |  提交时间：2017/12/30 Surface Roughness  Stray Light  Total Integrated Scattering  Bidirectional Scattering Distribution Function   Characterization of surface defects of silicon substrates by the total scattering and absorption 会议论文  OAI收割 作者:  Zhang, Kepeng;  Zhang, Xingxin;  Huang, Wei   |  收藏  |  浏览/下载：48/0  |  提交时间：2018/12/20 Absorption - Atomic force microscopy - Brillouin scattering - Light scattering - Microscopes - Optical systems - Photonics - Reflection - Silicon - Substrates - Surface roughness - Surface scattering   X-ray multilayer mid-frequency characterizations using speckle scanning techniques 会议论文  OAI收割 San Diego, CA, AUG 06-07, 2017 作者:  Jiang, H;  Yan, S;  Liang, DX;  Tian, NX   |  收藏  |  浏览/下载：26/0  |  提交时间：2019/12/31 INTERFACIAL ROUGHNESS  MIRRORS  SCATTERING  TOPOGRAPHY  METROLOGY  OPTICS  FIELD   Environmental awareness and vulnerability in the Yellow River Delta: Results based on a comprehensive household survey 期刊论文  OAI收割 Ocean and Coastal Management, 2016, 卷号: 120, 页码: 1-10 作者:  Wolters, Michel L.;  Sun, Zhongchang;  Huang, Chong;  Kuenzer, Claudia 收藏  |  浏览/下载：40/0  |  提交时间：2017/04/24 MICROWAVE DIELECTRIC BEHAVIOR  SURFACE-ROUGHNESS  SAR DATA  HYPERSPECTRAL INDEXES  MULTI-INCIDENCE  MODIS INDEXES  WET SOIL  VEGETATION  LEAF  SCATTERING   Integration method for directly analyzing interface statistics of periodic multilayers from X-ray scattering 期刊论文  OAI收割 JOURNAL OF SYNCHROTRON RADIATION, 2014, 卷号: 21, 页码: 97—103 Li, HC; Zhu, JT; Wang, ZS; Chen, H; Wang, YZ; Wang, J 收藏  |  浏览/下载：35/0  |  提交时间：2015/03/13 SPUTTERING PRESSURE  DIFFUSE-SCATTERING  ROUGHNESS  PERFORMANCE  SURFACE  FILM   A theoretical calculation of the impact of gan cap and alxga1-xn barrier thickness fluctuations on two-dimensional electron gas in a gan/alxga1-xn/gan heterostructure 期刊论文  iSwitch采集 Ieee transactions on electron devices, 2011, 卷号: 58, 期号: 12, 页码: 4272-4275 作者:  Liu, Guipeng;  Wu, Ju;  Lu, Yanwu;  Zhang, Biao;  Li, Chengming 收藏  |  浏览/下载：31/0  |  提交时间：2019/05/12 Cap-thickness-fluctuation (ctf) and barrierthickness fluctuation (btf) scattering  Interface roughness scattering  Two dimensional electron gas (2deg)   Surface modification of SiC mirror by IARE method (EI CONFERENCE) 会议论文  OAI收割 7th International Conference on Thin Film Physics and Applications, September 24, 2010 - September 27, 2010, Shanghai, China 作者:  Gao J. 收藏  |  浏览/下载：32/0  |  提交时间：2013/03/25 A method to prepare high quality SiC coating at low temperature using large aperture E-beam evaporation PVD equipment with ion assistance was developed for the surface modification of SiC mirror for space projects. This method was called Ion Assisted Reactive Evaporation (IARE). The modified SiC coating was prepared using CH4 and Si with Kaufman ion source by IARE at 300C and it had met the requirements of applications. The SiC coating prepared by this method was amorphous. It was dense  homogeneous and easy to be polished. The surface modification of a SiC mirror was carried out using SiC coating by this method and achieved a fine surface modification effect. The surface roughness (rms) of the SiC substrate was reduced to 0.862nm  the scattering coefficient was reduced to 2.79% and the reflectance coated with Ag film was improved simultaneously after the surface modification. The effect of surface modification using SiC coating was close to that of using Si coating. It can be drawn that this technological method to preparation SiC coating for the surface modification of SiC mirror is reasonable and effective. 2011 SPIE.