中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
首页
机构
成果
学者
登录
注册
登陆
×
验证码:
换一张
忘记密码?
记住我
×
校外用户登录
CAS IR Grid
机构
高能物理研究所 [6]
长春光学精密机械与物... [1]
化学研究所 [1]
光电技术研究所 [1]
上海应用物理研究所 [1]
长春应用化学研究所 [1]
更多
采集方式
OAI收割 [10]
iSwitch采集 [1]
内容类型
期刊论文 [10]
会议论文 [1]
发表日期
2018 [2]
2017 [1]
2014 [1]
2011 [1]
2010 [1]
2006 [1]
更多
学科主题
Physics [3]
筛选
浏览/检索结果:
共11条,第1-10条
帮助
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
题名升序
题名降序
提交时间升序
提交时间降序
作者升序
作者降序
发表日期升序
发表日期降序
Fabrication of absorption gratings with x-ray lithography for x-ray phase contrast imaging
期刊论文
iSwitch采集
International journal of modern physics b, 2018, 卷号: 32, 期号: 13, 页码: 8
作者:
Wang, Bo
;
Wang, Yu-Ting
;
Yi, Fu-Ting
;
Zhang, Tian-Chong
;
liu, Jing
收藏
  |  
浏览/下载:51/0
  |  
提交时间:2019/04/23
X-ray phase contrast imaging
X-ray lithography
High-aspect-ratio
Fabrication of absorption gratings with X-ray lithography for X-ray phase contrast imaging
期刊论文
OAI收割
INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2018, 卷号: 32, 期号: 13, 页码: 1850163
作者:
Wang, B
;
Wang B(王波)
;
Wang YT(王雨婷)
;
Yi FT(伊福廷)
;
Zhang TC(张天冲)
  |  
收藏
  |  
浏览/下载:31/0
  |  
提交时间:2019/09/24
X-ray phase contrast imaging
X-ray lithography
high-aspect-ratio
Fabrication of high aspect ratio nanoscale periodic structures by the soft X-ray interference lithography
期刊论文
OAI收割
MICROELECTRONIC ENGINEERING, 2017, 卷号: 170, 页码: 49-53
作者:
Zhao, J
;
Wu, YQ
;
Xue, CF
;
Yang, SM
;
Wang, LS
  |  
收藏
  |  
浏览/下载:30/0
  |  
提交时间:2017/12/08
Periodic Structures
Scintillator
Soft X-ray Interference Lithography
High Aspect Ratio
Preparation of long-range ordered nanostructures in semicrystalline diblock copolymer thin films using micromolding
期刊论文
OAI收割
高分子科学(英文版) chinese journal of polymer science, 2014, 卷号: 32, 期号: 9, 页码: 1188-1198
Zhang, Peng
;
Huang, Hai-ying
;
Chen, Yu
;
Yu,Shun
;
Krywka,Christina
;
Vayalil,Sarathlal K.
;
Roth,Stephan V.
;
He,Tian-bai
收藏
  |  
浏览/下载:32/0
  |  
提交时间:2015/10/21
X-RAY-SCATTERING
POLY-EPSILON-CAPROLACTONE
BLOCK-COPOLYMERS
CRYSTAL ORIENTATION
CRYSTALLIZATION BEHAVIOR
POLY(EPSILON-CAPROLACTONE)
LITHOGRAPHY
MORPHOLOGY
CHAINS
Fabrication of submicron photon sieve using E-beam lithography and X-ray lithography
期刊论文
OAI收割
MICROELECTRONIC ENGINEERING, 2011, 卷号: 88, 期号: 10, 页码: 3178-3181
作者:
Jiang, Wenbo
;
Hu, Song
;
Xie, Changqing
;
Zhu, Xiaoli
;
Zhao, Lixin
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2015/09/21
Submicron photon sieve
E-beam lithography
X-ray lithography
Key technique
Error analysis
Fabrication of a 256-bits organic memory by soft x-ray lithography
期刊论文
OAI收割
CHINESE PHYSICS B, 2010, 卷号: 19, 期号: 5
作者:
Liu Xing-Hua
;
Lu Wen-Sheng
;
Ji Zhuo-Yu
;
Tu De-Yu
;
Zhu Xiao-Li
  |  
收藏
  |  
浏览/下载:23/0
  |  
提交时间:2019/04/09
Molecular Memory
Crossbar Array
Soft X-ray Lithography
Electron Beam Lithography
The study on the epoxy resin compound X-ray refractive lens (EI CONFERENCE)
会议论文
OAI收割
ICO20: MEMS, MOEMS, and NEMS, August 21, 2005 - August 26, 2005, Changchun, China
作者:
Wang W.
;
Zhang J.
;
Zhang J.
;
Zhang J.
;
Wang W.
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2013/03/25
In this paper
the authors report their resent results of the study on the epoxy resin compound X-ray refractive lens. At the first
the theoretical results of the structure parameters for such a device are given. Then
the fabrication technologies are presented. They are deep soft X-ray lithography
mold-manufacturing and molding. The material of X-ray photoresist is PMMA
the mold is made of silicone rubber
and the material of the lens is epoxy resin. Some measured results by means of optical microscope and SEM are also shown. The structure height of the epoxy resin compound lens is measured to be 500 micrometers.
Fabrication of silicon nitride/refractory metal tantalum X-ray mask and its application
期刊论文
OAI收割
HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION, 2005, 卷号: 29, 页码: #REF!
作者:
Xie, CQ
;
Niu, JB
;
Wang, DQ
;
Dong, LJ
;
Chen, DP
收藏
  |  
浏览/下载:24/0
  |  
提交时间:2016/04/12
proximity X-ray lithography
X-ray mask
TaSi film
inductively coupled plasma
synchrotron radiation
Upgrading design of the 3BILA beamline for x-ray nanometre lithography of microelectronic devices at BSRF
期刊论文
OAI收割
CHINESE PHYSICS, 2004, 卷号: 13, 期号: 5, 页码: 731-736
作者:
Yi FT(伊福廷)
;
Peng LQ(彭良强)
;
Zhang JF(张菊芳)
;
Han Y(韩勇)
;
Yi, FT
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2016/06/28
synchrotron radiation
x-ray
x-ray lithography
synchrotron radiation beamline
X-ray lithography technology for the fabrication of deep-submicron T-shaped gate
期刊论文
OAI收割
HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION, 2003, 卷号: 27, 页码: #REF!
作者:
Xie, CQ
;
Chen, DP
;
Li, B
;
Wang, DQ
;
Ye, TC
收藏
  |  
浏览/下载:21/0
  |  
提交时间:2016/04/12
X-ray lithography
X-ray mask
deep-submicron T-shaped gate
blur