中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
金属研究所 [10]
采集方式
OAI收割 [10]
内容类型
期刊论文 [10]
发表日期
2014 [2]
2012 [1]
2011 [2]
2010 [2]
2009 [3]
学科主题
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Growth mechanism of duplex structural Cu-2(In,Sn) compound on single crystalline Cu substrate
期刊论文
OAI收割
Journal of Alloys and Compounds, 2014, 卷号: 588, 页码: 662-667
F. F. Tian
;
Z. Q. Liu
收藏
  |  
浏览/下载:37/0
  |  
提交时间:2014/03/14
48Sn52In
IMC
Morphology
Orientation relationship
EBSD
interfacial reactions
soldering reaction
joint reliability
void
formation
solid-state
sn
cu3sn
alloy
creep
Phase transformation between Cu(In,Sn)(2) and Cu-2(In,Sn) compounds formed on single crystalline Cu substrate during solid state aging
期刊论文
OAI收割
Journal of Applied Physics, 2014, 卷号: 115, 期号: 4
F. F. Tian
;
Z. Q. Liu
;
J. D. Guo
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2014/04/18
heterogeneous binary-systems
2 elementary substances
intermetallic
compounds
reaction-diffusion
growth
layers
interface
solders
joints
cu3sn
Interfacial microstructure and mechanical properties of SnBi/Cu joints by alloying Cu substrate
期刊论文
OAI收割
Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing, 2012, 卷号: 532, 页码: 167-177
H. F. Zou
;
Q. K. Zhang
;
Z. F. Zhang
收藏
  |  
浏览/下载:23/0
  |  
提交时间:2013/02/05
Sn-Bi solder
Void
Cu3Sn
Bi segregation
Interfacial embrittlement
Cu
alloys
solder interconnect
grain-boundaries
single-crystal
bismuth
embrittlement
segregation
copper
strength
Effects of Bi segregation on the tensile properties of Cu/Cu(3)Sn(100) interface
期刊论文
OAI收割
Microelectronics Reliability, 2011, 卷号: 51, 期号: 12, 页码: 2330-2335
X. Y. Pang
;
Z. Q. Liu
;
S. Q. Wang
;
J. K. Shang
收藏
  |  
浏览/下载:26/0
  |  
提交时间:2012/04/13
crack-growth-behavior
lead-free solders
alpha-al2o3(0001)/cu(111)
interface
mechanical strength
reactive interface
molecular-dynamics
joints
cu3sn
cu
1st-principles
Fracture behaviors and strength of Cu(6)Sn(5) intermetallic compounds by indentation testing
期刊论文
OAI收割
Journal of Applied Physics, 2011, 卷号: 110, 期号: 1
Q. K. Zhang
;
J. Tan
;
Z. F. Zhang
收藏
  |  
浏览/下载:19/0
  |  
提交时间:2012/04/13
lead-free solders
mechanical-properties
interfacial reactions
deformation-behavior
joints
nanoindentation
sn
metallization
toughness
cu3sn
First-principles Investigation of Bi Segregation at the Solder Interface of Cu/Cu(3)Sn(010)
期刊论文
OAI收割
Journal of Materials Science & Technology, 2010, 卷号: 26, 期号: 12, 页码: 1057-1062
X. Y. Pang
;
Z. Q. Liu
;
S. Q. Wang
;
J. K. Shang
收藏
  |  
浏览/下载:26/0
  |  
提交时间:2012/04/13
First-principles calculation
Segregation
Bismuth
Interface
SnBi
solder
reactive interface
cu3sn
cu
growth
principles
fracture
crystal
bismuth
joints
copper
Weakening of the Cu/Cu(3)Sn(100) Interface by Bi Impurities
期刊论文
OAI收割
Journal of Electronic Materials, 2010, 卷号: 39, 期号: 8, 页码: 1277-1282
X. Y. Pang
;
P. J. Shang
;
S. Q. Wang
;
Z. Q. Liu
;
J. K. Shang
收藏
  |  
浏览/下载:23/0
  |  
提交时间:2012/04/13
DFT
bismuth
impurity
interface
bonding
solder interconnect
molecular-dynamics
bismuth solder
embrittlement
joints
copper
cu3sn
pseudopotentials
segregation
fracture
Growth mechanisms of Cu3Sn on polycrystalline and single crystalline Cu substrates
期刊论文
OAI收割
ACTA MATERIALIA, 2009, 卷号: 57, 期号: 16, 页码: 4697-4706
作者:
Shang, P. J.
;
Liu, Z. Q.
;
Pang, X. Y.
;
Li, D. X.
;
Shang, J. K.
  |  
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2021/02/02
Cu3Sn
Growth mechanism
Interface
Soldering
Transmission electron microscopy
An ordered structure of Cu3Sn in Cu-Sn alloy investigated by transmission electron microscopy
期刊论文
OAI收割
JOURNAL OF ALLOYS AND COMPOUNDS, 2009, 卷号: 469, 期号: 1-2, 页码: 129-136
作者:
Sang, Mahan
;
Du, Kui
;
Ye, Hengqiang
  |  
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2021/02/02
Intermetallics
Crystal structure
Cu3Sn
Transmission electron microscopy
An ordered structure of Cu3Sn in Cu-Sn alloy investigated by transmission electron microscopy
期刊论文
OAI收割
JOURNAL OF ALLOYS AND COMPOUNDS, 2009, 卷号: 469, 期号: 1-2, 页码: 129-136
作者:
Sang, Mahan
;
Du, Kui
;
Ye, Hengqiang
  |  
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2021/02/02
Intermetallics
Crystal structure
Cu3Sn
Transmission electron microscopy