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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
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金属研究所 [4]
中国科学院大学 [2]
长春光学精密机械与物... [1]
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期刊论文 [7]
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Reliability and joint reliability importance in a consecutive-k-within-m-out-of-n:f system with markov-dependent components
期刊论文
iSwitch采集
Ieee transactions on reliability, 2016, 卷号: 65, 期号: 2, 页码: 802-815
作者:
Zhu, Xiaoyan
;
Boushaba, Mahmoud
;
Reghioua, Mohamed
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Joint reliability importance in a consecutive-k-out-of-n:f system and an m-consecutive-k-out-of-n:f system for markov-dependent components
期刊论文
iSwitch采集
Ieee transactions on reliability, 2015, 卷号: 64, 期号: 2, 页码: 784-798
作者:
Zhu, Xiaoyan
;
Boushaba, Mahmoud
;
Reghioua, Mohamed
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  |  
Phase identification on the intermetallic compound formed between eutectic SnIn solder and single crystalline Cu substrate
期刊论文
OAI收割
Journal of Alloys and Compounds, 2014, 卷号: 591, 页码: 351-355
F. F. Tian
;
Z. Q. Liu
;
P. J. Shang
;
J. D. Guo
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Growth mechanism of duplex structural Cu-2(In,Sn) compound on single crystalline Cu substrate
期刊论文
OAI收割
Journal of Alloys and Compounds, 2014, 卷号: 588, 页码: 662-667
F. F. Tian
;
Z. Q. Liu
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Effects of solder dimension on the interfacial shear strength and fracture behaviors of Cu/Sn-3Cu/Cu joints
期刊论文
OAI收割
Scripta Materialia, 2012, 卷号: 67, 期号: 7-8, 页码: 637-640
L. M. Yang
;
Q. K. Zhang
;
Z. F. Zhang
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Warpage and Reliability of a 3D-MCM on an Embedded Substrate With Multiple Interconnection Method
期刊论文
OAI收割
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2010, 卷号: 33, 期号: 3, 页码: 571-581
Xu, GW
;
Geng, F
;
Huang, QP
;
Luo, L
;
Zhou, JA
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Dome design and coupled thermal-mechanical analysis of supersonic missile (EI CONFERENCE)
会议论文
OAI收割
2009 International Conference on Optical Instruments and Technology, OIT 2009, October 19, 2009 - October 22, 2009, Shanghai, China
Xing-qiao A.
;
Qun W.
;
Hong-guang J.
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  |  
Microstructural evolution and cracking of Pb-free ball grid array assemblies under thermal cycling
期刊论文
OAI收割
Journal of Materials Science & Technology, 2007, 卷号: 23, 期号: 1, 页码: 85-91
W. Wang
;
Z. G. Wang
;
A. P. Xian
;
J. K. Shang
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