机构

• 高能物理研究所 [4]
• 半导体研究所 [2]
• 金属研究所 [1]

采集方式

• OAI收割 [6]
• iSwitch采集 [1]

内容类型

• 期刊论文 [7]

发表日期

• 2020 [1]
• 2018 [1]
• 2010 [2]
• 2009 [2]
• 2004 [1]

学科主题

• Physics [2]
• 光电子学 [1]

筛选

浏览/检索结果: 共7条，第1-7条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 High-Resolution X-Ray Diffraction Analysis of Epitaxial Films 期刊论文  OAI收割 ACTA METALLURGICA SINICA, 2020, 卷号: 56, 期号: 1, 页码: 99-111 作者:  Li Changji;  Zou Minjie;  Zhang Lei;  Wang Yuanming;  Wang Sucheng   |  收藏  |  浏览/下载：21/0  |  提交时间：2021/02/02 film growth  epitaxial film  high-resolution X-ray diffraction  reciprocal space mapping   Dislocation-related photoluminescence of GeSn films grown on Ge (001) substrates by molecular beam epitaxy 期刊论文  OAI收割 SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2018, 卷号: 33, 期号: 12, 页码: 125022 作者:  Yang, Xinju;  Jia QJ(贾全杰);  Jiang, Zuimin;  Jia, Quanjie;  Zhong, Zhenyang   |  收藏  |  浏览/下载：60/0  |  提交时间：2019/10/11 GeSn  dislocation-related photoluminescence  molecular beam epitaxy  microstructure  x-ray diffraction reciprocal space mapping   Evaluation of both composition and strain distributions in ingan epitaxial film using x-ray diffraction techniques 期刊论文  iSwitch采集 Chinese physics b, 2010, 卷号: 19, 期号: 10, 页码: 7 作者:  Guo Xi;  Wang Hui;  Jiang De-Sheng;  Wang Yu-Tian;  Zhao De-Gang 收藏  |  浏览/下载：40/0  |  提交时间：2019/05/12 Ingan  In-plane grazing incidence x-ray diffraction  Reciprocal space mapping  Biaxial strain   Evaluation of both composition and strain distributions in InGaN epitaxial film using x-ray diffraction techniques 期刊论文  OAI收割 chinese physics b, 2010, 卷号: 19, 期号: 10, 页码: art. no. 106802 Guo X (Guo Xi); Wang H (Wang Hui); Jiang DS (Jiang De-Sheng); Wang YT (Wang Yu-Tian); Zhao DG (Zhao De-Gang); Zhu JJ (Zhu Jian-Jun); Liu ZS (Liu Zong-Shun); Zhang SM (Zhang Shu-Ming); Yang H (Yang Hui) 收藏  |  浏览/下载：35/0  |  提交时间：2010/11/02 InGaN  In-plane grazing incidence x-ray diffraction  reciprocal space mapping  biaxial strain  CRITICAL LAYER THICKNESS  OPTICAL-PROPERTIES  LATTICE-CONSTANTS  GAN  HETEROSTRUCTURES  ALLOYS  WELLS   High resolution X-ray diffraction investigation of epitaxially grown SrTiO3 thin films by laser-MBE 期刊论文  OAI收割 CHINESE PHYSICS C, 2009, 卷号: 33, 期号: 11, 页码: 949-953 作者:  Zhai, ZY;  Wu, XS;  Jia QJ(贾全杰);  Jia, QJ 收藏  |  浏览/下载：23/0  |  提交时间：2016/06/29 laser-MBE  grazing incident X-ray diffraction  reciprocal space mapping   High resolution X-ray diffraction investigation of epitaxially grown SrTiO_3 thin films by laser-MBE 期刊论文  OAI收割 中国物理C, 2009, 期号: 11, 页码: 949-953 作者:  Zhai ZY(翟章印);  Wu XS(吴小山);  Jia QJ(贾全杰) 收藏  |  浏览/下载：9/0  |  提交时间：2015/12/25 laser-MBE  grazing incident X-ray diffraction  reciprocal space mapping   Microstructures and strain relaxation in modulation-doped AlxGa1-xN/GaN heterostructures 期刊论文  OAI收割 INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2004, 卷号: 18, 期号: 7, 页码: 989-998 作者:  Tan, WS;  Shen, B;  Sha, H;  Cai, HL;  Wu, XS 收藏  |  浏览/下载：17/0  |  提交时间：2016/06/29 high resolution X-ray diffraction  metal organic chemical vapor deposition  reciprocal space mapping  semiconducting III-V nitride  strain relaxation  relaxation line model