中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
半导体研究所 [4]
高能物理研究所 [1]
采集方式
OAI收割 [4]
iSwitch采集 [1]
内容类型
期刊论文 [4]
会议论文 [1]
发表日期
2007 [1]
2004 [1]
2003 [1]
2001 [2]
学科主题
半导体材料 [3]
Physics [1]
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Effect of growth conditions on the gan thin film by sputtering deposition
期刊论文
iSwitch采集
Journal of crystal growth, 2007, 卷号: 299, 期号: 2, 页码: 268-271
作者:
Zhang, C. G.
;
Bian, L. F.
;
Chen, W. D.
;
Hsu, C. C.
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2019/05/12
Phase equilibria
Radio-frequency magnetron sputtering
Sputtering
Gallium compounds
Gallium nitride
Semiconducting gallium compounds
Semiconducting iii-v materials
Microstructures and strain relaxation in modulation-doped AlxGa1-xN/GaN heterostructures
期刊论文
OAI收割
INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2004, 卷号: 18, 期号: 7, 页码: 989-998
作者:
Tan, WS
;
Shen, B
;
Sha, H
;
Cai, HL
;
Wu, XS
收藏
  |  
浏览/下载:18/0
  |  
提交时间:2016/06/29
high resolution X-ray diffraction
metal organic chemical vapor deposition
reciprocal space mapping
semiconducting III-V nitride
strain relaxation
relaxation line model
Void formation and failure in InGaN/AlGaN double heterostructures
期刊论文
OAI收割
journal of crystal growth, 2003, 卷号: 253, 期号: 1-4, 页码: 404-412
作者:
Han PD
收藏
  |  
浏览/下载:214/2
  |  
提交时间:2010/08/12
defects
metalorganic vapor phase epitaxy
nitrides
semiconducting III-V materials
light emitting diodes
LIGHT-EMITTING-DIODES
MULTIPLE-QUANTUM WELLS
THREADING EDGE DISLOCATION
VAPOR-PHASE EPITAXY
N-TYPE GAN
GALLIUM NITRIDE
GROWTH STOICHIOMETRY
SCATTERING
DEFECTS
LUMINESCENCE
Hydrogen behavior in GaN epilayers grown by NH3-MBE
期刊论文
OAI收割
journal of crystal growth, 2001, 卷号: 227, 期号: 0, 页码: 371-375
Kong MY
;
Zhang JP
;
Wang XL
;
Sun DZ
收藏
  |  
浏览/下载:114/8
  |  
提交时间:2010/08/12
impurities
molecular beam epitaxy
nitrides
semiconducting III-V materials
GALLIUM NITRIDE
SAPPHIRE SUBSTRATE
DEFECTS
HETEROSTRUCTURE
SEMICONDUCTORS
STRESS
Hydrogen behavior in GaN epilayers grown by NH3-MBE
会议论文
OAI收割
11th international conference on molecular beam epitaxy (mbe-xi), beijing, peoples r china, sep 11-15, 2000
Kong MY
;
Zhang JP
;
Wang XL
;
Sun DZ
收藏
  |  
浏览/下载:23/0
  |  
提交时间:2010/11/15
impurities
molecular beam epitaxy
nitrides
semiconducting III-V materials
GALLIUM NITRIDE
SAPPHIRE SUBSTRATE
DEFECTS
HETEROSTRUCTURE
SEMICONDUCTORS
STRESS