中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
机构
采集方式
内容类型
发表日期
学科主题
  • 半导体材料 [8]
筛选

浏览/检索结果: 共8条,第1-8条 帮助

限定条件    
条数/页: 排序方式:
Nanostructural instability of single-walled carbon nanotubes during electron beam induced shrinkage 期刊论文  OAI收割
carbon, 2011, 卷号: 49, 期号: 9, 页码: 3120-3124
Zhu XF; Li LX; Huang SL; Wang ZG; Lu GQ; Sun CH; Wang LZ
收藏  |  浏览/下载:25/3  |  提交时间:2011/07/05
Strong room-temperature ferromagnetism in Cu-implanted nonpolar GaN films 期刊论文  OAI收割
journal of applied physics, 2009, 卷号: 106, 期号: 11, 页码: art. no. 113921
Sun LL; Yan FW; Zhang HX; Wang JX; Zeng YP; Wang GH; Li JM
收藏  |  浏览/下载:99/0  |  提交时间:2010/04/03
ZnO thin films on Si(111) grown by pulsed laser deposition from metallic Zn target 期刊论文  OAI收割
applied surface science, 2006, 卷号: 253, 期号: 2, 页码: 841-845
Zhao J (Zhao Jie); Hu LZ (Hu Lizhong); Wang ZY (Wang Zhaoyang); Sun J (Sun Jie); Wang ZJ (Wang Zhijun)
收藏  |  浏览/下载:24/0  |  提交时间:2010/04/11
Microdefects and electrical uniformity of InP annealed in phosphorus and iron phosphide ambiances 期刊论文  OAI收割
journal of crystal growth, 2003, 卷号: 259, 期号: 1-2, 页码: 1-7
Dong ZY; Zhao YW; Zeng YP; Duan ML; Sun WR; Jiao JH; Lin LY
收藏  |  浏览/下载:351/16  |  提交时间:2010/08/12
Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers 会议论文  OAI收割
9th international conference on defects: recognition, imaging and physics in semiconductors (drip ix), rimini, italy, sep 24-28, 2001
Zhao YW; Sun NF; Dong HW; Jiao JH; Zhao JQ; Sun TN; Lin LY
收藏  |  浏览/下载:14/0  |  提交时间:2010/11/15
Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers 期刊论文  OAI收割
materials science and engineering b-solid state materials for advanced technology, 2002, 卷号: 91, 期号: 0, 页码: 521-524
Zhao YW; Sun NF; Dong HW; Jiao JH; Zhao JQ; Sun TN; Lin LY
收藏  |  浏览/下载:82/19  |  提交时间:2010/08/12
Effects of annealing time and Si cap layer thickness on the Si/SiGe/Si heterostructures thermal stability 期刊论文  OAI收割
journal of crystal growth, 2001, 卷号: 227, 期号: 0, 页码: 766-769
Gao F; Lin YX; Huang DD; Li JP; Sun DZ; Kong MY; Zeng YP; Li JM; Lin LY
收藏  |  浏览/下载:97/14  |  提交时间:2010/08/12
Effects of annealing time and Si cap layer thickness on the Si/SiGe/Si heterostructures thermal stability 会议论文  OAI收割
11th international conference on molecular beam epitaxy (mbe-xi), beijing, peoples r china, sep 11-15, 2000
Gao F; Lin YX; Huang DD; Li JP; Sun DZ; Kong MY; Zeng YP; Li JM; Lin LY
收藏  |  浏览/下载:8/0  |  提交时间:2010/11/15