中国科学院机构知识库网格系统: 检索

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	Imbricatala novitas gen. et sp. nov., a new planthopper of family Inoderbidae (Hemiptera: Fulgoromorpha: Fulgoridioidea) from mid-Cretaceous Kachin amber of northern Myanmar 期刊论文 OAI收割 PALAEONTOGRAPHICA ABTEILUNG A-PALAOZOOLOGIE-STRATIGRAPHIE, 2024, 页码: 12 作者: Zhang, Fazhan; Bourgoin, Thierry; Song, Zhishun; Chen, Rong; Xiao, Chuantao \| 收藏 \|
	Engineering and Microscopic Mechanism of Quantum Emitters Induced by Heavy Ions in hBN 期刊论文 OAI收割 ACS PHOTONICS, 2021, 卷号: 8, 期号: 10, 页码: 2912-2922 作者: Gu, Rui; Wang, Lei; Zhu, Huiping; Han, Shuangping; Bai, Yurong \| 收藏 \|
	The prevalence and related factors of metabolic syndrome in outpatients with first-episode drug-naive major depression comorbid with anxiety 期刊论文 OAI收割 SCIENTIFIC REPORTS, 2021, 卷号: 11, 期号: 1, 页码: 9 作者: Zhong, Yinghua; Hu, Manji; Wang, Qiang; Yang, Zhendong; Zhu, Na \| 收藏 \|
	Comparison of X-Ray and Proton Irradiation Effects on the Characteristics of InGaN/GaN Multiple Quantum Wells Light-Emitting Diodes 期刊论文 OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2020, 卷号: 67, 期号: 7, 页码: 1345-1350 作者: \| 收藏 \|
	The Impacts of Heavy Ion Energy on Single Event Upsets in SOI SRAMs 期刊论文 OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018 作者: Song Gu; Jie Liu; Jinshun Bi; Fazhan Zhao; zhangang Zhang \| 收藏 \|
	The Impacts of Heavy Ion Energy on Single Event Upsets in SOI SRAMs 期刊论文 OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 页码: 1091-1100 作者: Gu, Song; Liu, Jie; Bi, Jinshun; Zhao, Fazhan; Zhang, Zhangang \| 收藏 \|
	Various approaches of laparoscopic common bile duct exploration plus primary duct closure for choledocholithiasis: A systematic review and meta-analysis 期刊论文 OAI收割 HEPATOBILIARY & PANCREATIC DISEASES INTERNATIONAL, 2018, 卷号: 17 作者: He MingYan; Zhou XiaDong; Chen Hao; Zheng Peng; Zhang FaZhan \| 收藏 \|
	Influence of edge effects on single event upset susceptibility of SOI SRAMs 期刊论文 OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2015, 卷号: 342, 页码: 286-291 作者: Xi, Kai; Liu, Gang; Hou, Mingdong; Geng, Chao; Bi, Jinshun \| 收藏 \|
	Investigation of Threshold Ion Range for Accurate Single Event Upset Measurements in Both SOI and Bulk Technologies 期刊论文 OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2014, 卷号: 61, 页码: 1459-1467 作者: Luo, Jie; Yao, Huijun; Sun, Youmei; Xi, Kai; Geng, Chao \| 收藏 \|