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• 金属研究所 [3]
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• OAI收割 [13]
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• 期刊论文 [12]
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浏览/检索结果: 共14条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Mirrors for Space Telescopes: Degradation Issues 期刊论文  OAI收割 APPLIED SCIENCES-BASEL, 2020, 卷号: 10, 期号: 21 作者:  Garoli, Denis;  De Marcos, Luis V. Rodriguez;  Larruquert, Juan, I;  Corso, Alain J.;  Zaccaria, Remo Proietti   |  收藏  |  浏览/下载：31/0  |  提交时间：2020/12/16 THIN-FILM  MULTILAYER COATINGS  SILICON-CARBIDE  ALUMINUM FILMS  IN-ORBIT  ULTRAVIOLET  CONTAMINATION  REFLECTANCE  PROTON  ENERGY   Mirrors for Space Telescopes: Degradation Issues 期刊论文  OAI收割 APPLIED SCIENCES-BASEL, 2020, 卷号: 10, 期号: 21 作者:  Garoli, Denis;  De Marcos, Luis V. Rodriguez;  Larruquert, Juan, I;  Corso, Alain J.;  Zaccaria, Remo Proietti   |  收藏  |  浏览/下载：17/0  |  提交时间：2021/12/01 THIN-FILM  MULTILAYER COATINGS  SILICON-CARBIDE  ALUMINUM FILMS  IN-ORBIT  ULTRAVIOLET  CONTAMINATION  REFLECTANCE  PROTON  ENERGY   Al doping effect on the morphological, structural and photocatalytic properties of TiO2 thin layers 期刊论文  OAI收割 THIN SOLID FILMS, 2016, 卷号: 616, 期号: 无, 页码: 655-661 作者:  Bensouici, F.;  Bououdina, M.;  Dakhel, A. A.;  Souier, T.;  Tala-Ighil, R. 收藏  |  浏览/下载：29/0  |  提交时间：2017/09/11 Aluminum  Doped Titanium Dioxide  Thin Film  Anatase  Microstructure  Photocatalytic Degradation   Electrodeposition and characterization of nanocrystalline CoNiFe films 期刊论文  OAI收割 Thin Solid Films, 2012, 卷号: 520, 期号: 9, 页码: 3553-3557 Y. Chen; Q. P. Wang; C. Cai; Y. N. Yuan; F. H. Cao; Z. Zhang; J. Q. Zhang 收藏  |  浏览/下载：11/0  |  提交时间：2013/02/05 Nanocrystalline CoNiFe film  Electrodeposition  Cyclic voltammetry  Impedance spectroscopy  feconi thin-films  electrochemical nucleation  ingot iron  impedance  corrosion  kinetics  behavior  coercivity  aluminum  density   Aluminum induced crystallization of strongly (111) oriented polycrystalline silicon thin film and nucleation analysis 期刊论文  iSwitch采集 Science china-technological sciences, 2010, 卷号: 53, 期号: 11, 页码: 3002-3005 作者:  Huang TianMao;  Chen NuoFu;  Zhang XingWang;  Bai YiMing;  Yin ZhiGang 收藏  |  浏览/下载：39/0  |  提交时间：2019/05/12 Polycrystalline silicon thin film  Aluminum induced crystallization  (111) preferred orientation   Low-Temperature Wafer Bonding Based on Gold-Induced Crystallization of Amorphous Silicon 期刊论文  OAI收割 IEEE ELECTRON DEVICE LETTERS, 2010, 卷号: 31, 期号: 9, 页码: 1011-1013 Jing, ER; Xiong, B; Wang, YL 收藏  |  浏览/下载：20/0  |  提交时间：2011/12/17 INDUCED LATERAL CRYSTALLIZATION  METAL-INDUCED CRYSTALLIZATION  THIN-FILM  ALUMINUM   Aluminum induced crystallization of strongly (111) oriented polycrystalline silicon thin film and nucleation analysis 期刊论文  OAI收割 science china-technological sciences, 2010, 卷号: 53, 期号: 11, 页码: 3002-3005 Huang TM (Huang TianMao); Chen NF (Chen NuoFu); Zhang XW (Zhang XingWang); Bai YM (BaiYiMing); Yin ZG (Yin ZhiGang); Shi HW (Shi HuiWei); Zhang H (Zhang Han); Wang Y (Wang Yu); Wang YS (Wang YanShuo); Yang XL (Yang XiaoLi) 收藏  |  浏览/下载：29/0  |  提交时间：2010/11/14 polycrystalline silicon thin film  aluminum induced crystallization  (111) preferred orientation  INDUCED LAYER-EXCHANGE  AMORPHOUS-SILICON  SOLAR-CELLS  GLASS  SI  ORIENTATION  MODEL   Optical characteristic of ion beam sputter deposited aluminum thin films (EI CONFERENCE) 会议论文  OAI收割 International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China 作者:  Yang H.;  Liu L.;  Liu L. 收藏  |  浏览/下载：28/0  |  提交时间：2013/03/25 Aluminum is a typical active metal very easy to oxidize. An oxide surface layer of about 2-6nm quickly formed in air which adds difficulty to the optical constants determination. An ex-situ method is used to determine the optical constants of aluminum thin films. First  Second  Third  alumina (Al2O3) thin film is deposited by ion beam sputter deposition. The optical constants and thickness are determined by spectral ellipsoemtry (SE). The thickness is verified by grazing x-ray reflection (GXRR) fitting method  Al thin film with an Al2O3 cap layer on top is deposited. This cap layer is of the same deposition condition with the first step. By fitting the GXRR spectra  based on the acquired structure information  the structure information (the thickness of the aluminum and the cap layer  the ellipsometric spectra are fitted. The optical constants of the aluminum layer are extracted with the aid of the Drude model. Finally  surface roughness and the diffusion between Al-Al2O 3) is obtained  an induced transmission filter (ITF) is designed and deposited.   Formation of dendritic nanostructures in Pyrex glass anodically bonded to silicon coated with an aluminum thin film 会议论文  OAI收割 14th International Conference on the Strength of Materials (ICSMA 14), Xian Jiaotong Univ, Xian, PEOPLES R CHINA, JUN 04-09, 2006 作者:  Hu YQ(胡宇群);  Zhao YP(赵亚溥);  Yu TX(余同希);  Zhao YP 收藏  |  浏览/下载：1243/48  |  提交时间：2009/07/23 Anodic Bonding  Dendritic Nanostructures  Aluminum Thin Film  Depletion Layer  Mems  Ion Drift Processes  Borosilicate Glass  Depletion   Formation Of Dendritic Nanostructures In Pyrex Glass Anodically Bonded To Silicon Coated With An Aluminum Thin Film 期刊论文  OAI收割 Materials Science And Engineering A-Structural Materials Properties Microstructure And Processing, 2008, 页码: 611-616 作者:  Hu YQ(胡宇泉);  Zhao YP(赵亚溥);  Yu TX(余同希) 收藏  |  浏览/下载：858/49  |  提交时间：2009/08/03 Anodic Bonding  Dendritic Nanostructures  Aluminum Thin Film  Depletion Layer  Mems  Ion Drift Processes  Borosilicate Glass  Depletion