中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
首页
机构
成果
学者
登录
注册
登陆
×
验证码:
换一张
忘记密码?
记住我
×
校外用户登录
CAS IR Grid
机构
微电子研究所 [3]
长春光学精密机械与物... [2]
物理研究所 [1]
新疆理化技术研究所 [1]
上海微系统与信息技术... [1]
采集方式
OAI收割 [8]
内容类型
会议论文 [3]
外文期刊 [3]
期刊论文 [2]
发表日期
2020 [1]
2011 [1]
2009 [3]
2007 [1]
2006 [2]
学科主题
Engineerin... [1]
筛选
浏览/检索结果:
共8条,第1-8条
帮助
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
题名升序
题名降序
提交时间升序
提交时间降序
作者升序
作者降序
发表日期升序
发表日期降序
Research on attitude measurement precision of star sensor influenced by space radiation damage
会议论文
OAI收割
Beijing, PEOPLES R CHINA, DEC 03-05, 2019
作者:
Feng, J (Feng Jie)
;
Li, YD (Li Yudong)
;
Guo, Q (Guo Qi)
  |  
收藏
  |  
浏览/下载:33/0
  |  
提交时间:2021/08/25
CCD image sensor
CMOS image sensor
performance degradation
radiation damage
star sensor
Design and simulation of CMOS star sensor lens with large relative aperture and wide field (EI CONFERENCE)
会议论文
OAI收割
2011 International Conference on Electronic and Mechanical Engineering and Information Technology, EMEIT 2011, August 12, 2011 - August 14, 2011, Harbin, China
Zhong X.
;
Jin G.
收藏
  |  
浏览/下载:61/0
  |  
提交时间:2013/03/25
A 50mm focal length
F/1.25
Gaussian type optical system is designed in this paper
which has 20field of view. Actual star image adding optical cross-talk effect of CMOS(Complementary Metal Oxide Semiconductor)
detector is simulated by non-sequential ray tracing in ZEMAX optical design and analysis software to evaluate its performance. The distortion relative to image spot centriod is introduced and calculated by simulated star images
which is less than 0.03% of lens in this paper. Thermal adaptability is discussed by opt-mechanic thermal analysis
which shows the RMS spot radius of marginal filed changes less than 0.7m under 10C temperature gradient
and changes less than 1m during homogeneous temperature changing from 40C to 40C. The results of analyses and simulations show the design of this lens can achieve the requirement of high precision CMOS star sensor well. 2011 IEEE.
Finite-element study of strain field in strained-Si MOSFET
期刊论文
OAI收割
MICRON, 2009, 卷号: 40, 期号: 2, 页码: 274
Liu, HH
;
Duan, XF
;
Xu, QX
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2013/09/17
BEAM ELECTRON-DIFFRACTION
HOLE MOBILITY ENHANCEMENT
ELASTIC RELAXATION
LAYER SUPERLATTICES
EFFECT TRANSISTORS
CMOS PERFORMANCE
SILICON
SPECIMENS
PMOSFETS
Finite-element study of strain field in strained-Si MOSFET
外文期刊
OAI收割
2009
作者:
Liu, HH
;
Xu, QX
;
Duan, XF
  |  
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2010/11/26
Beam Electron-diffraction
Hole Mobility Enhancement
Elastic Relaxation
Layer Superlattices
Effect Transistors
Cmos Performance
Silicon
Specimens
Pmosfets
Design and optimization considerations for bulk gate-all-around nanowire MOSFETs
外文期刊
OAI收割
2009
作者:
Cai, XW
;
Zhou, HJ
;
Xu, QX
;
Song, Y
  |  
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2010/11/26
Device-simulation
Cmos Devices
Silicon
Performance
Transistors
Fabrication
Diameter
Impact
Concave-suspended high-Q solenoid inductors with an RFIC-compatible bulk-micromachining technology
期刊论文
OAI收割
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2007, 卷号: 54, 期号: 4, 页码: 882-885
Gu, L
;
Li, XX
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2012/02/01
HIGH-PERFORMANCE INDUCTORS
SPIRAL INDUCTORS
CMOS PROCESS
SILICON
FABRICATION
SUBSTRATE
DESIGN
COPPER
Geometrical modulation transfer function of different active pixel of CMOS APS (EI CONFERENCE)
会议论文
OAI收割
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 2, 2005 - November 5, 2005, Zian, China
作者:
Li J.
;
Liu J.
;
Liu J.
;
Liu J.
;
Li J.
收藏
  |  
浏览/下载:26/0
  |  
提交时间:2013/03/25
The geometrical Modulation Transfer Function (MTF) of CMOS APS (active pixel sensor) is analyzed in this paper. Advanced APS have been designed and fabricated where different pixel shapes such as square
rectangle and L shape
were placed
because the amplifier circuit and other function circuits inter pixel of APS take up some pixel area. MTF is an important figure of merit in focal plane array imaging sensors. Research on analyzing the MTF for the proper pixel shape is currently in progress for a centroidal configuration of a target position. MTF will give us a more complete understanding of the tradeoffs opposed by the different pixel designs and by the signal processing conditions. Based on image sensor sampling and reconstructing model
the MTF expression of any active pixel shape has been deduced in this paper. According to actual pixel shape
three different active area pixels were analyzed
they were square
rectangle
and L shape
their Fill Factor (FF) is 30%
44% and 55%
respectively. Results of simulation experiments indicate that different pixel geometrical characteristics contribute significantly to the figures of their MTF. Different geometrical shape of active sensitive area of pixel and different station in pixel would influence MTF figures. The analysis results are important in designing better APS pixel and more important in analyzing imaging system performance of APS subpixel precision system.
A short-channel SOI RF power LDMOS technology with TiSi2 salicide on dual sidewalls with cutoff frequency f(T) similar to 19.3 GHz
外文期刊
OAI收割
2006
作者:
Yang, R
;
Li, JF
;
Qian, H
;
Lo, GQ
;
Balasubramanian, N
  |  
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2010/11/26
Thin-film Soi
Device
Mosfet
Cmos
Silicon
Performance
Analog