机构

• 新疆理化技术研究所 [7]

采集方式

• OAI收割 [7]

内容类型

• 期刊论文 [7]

发表日期

• 2019 [1]
• 2018 [3]
• 2017 [1]
• 2011 [2]

学科主题

• Engineerin... [1]
• Physics [1]

筛选

浏览/检索结果: 共7条，第1-7条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Synergistic effect of enhanced low-dose-rate sensitivity and single event transient in bipolar voltage comparator LM139 期刊论文  OAI收割 JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2019, 卷号: 56, 期号: 2, 页码: 172-178 作者:  Yao, S (Yao, Shuai)[ 1,2,3 ];  Lu, W (Lu, Wu)[ 1,2,4 ];  Yu, X (Yu, Xin)[ 1,2 ];  Wang, X (Wang, Xin)[ 1,2 ];  Li, XL (Li, Xiaolong)[ 1,2,3 ]   |  收藏  |  浏览/下载：100/0  |  提交时间：2019/02/25 Enhanced low dose rate sensitivity  single event transient  bipolar voltage comparator  synergistic effect   Estimation of low-dose-rate degradation on bipolar linear circuits using different accelerated evaluation methods 期刊论文  OAI收割 ACTA PHYSICA SINICA, 2018, 卷号: 67, 期号: 9, 页码: 202-209 作者:  Li, XL (Li Xiao-Long)[ 1,2,3 ];  Lu, W (Lu Wu)[ 1,2 ];  Wang, X (Wang Xin)[ 1,2,3 ];  Guo, Q (Guo Qi)[ 1,2 ];  He, CF (He Cheng-Fa)[ 1,2 ]   |  收藏  |  浏览/下载：44/0  |  提交时间：2018/09/27 Bipolar Circuit  Enhanced Low-dose-rate Sensitivity  Accelerated Evaluation Method   Estimation of enhanced low dose rate sensitivity mechanisms using temperature switching irradiation on gate-controlled lateral PNP transistor 期刊论文  OAI收割 CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 3, 页码: 1-9 作者:  Li, XL (Li, Xiao-Long);  Lu, W (Lu, Wu);  Wang, X (Wang, Xin);  Yu, X (Yu, Xin);  Guo, Q (Guo, Qi)   |  收藏  |  浏览/下载：31/0  |  提交时间：2018/05/14 Ionizing Radiation Damage  Enhanced Low Dose Rate Sensitivity (Eldrs)  Switched Temperature Irradiation  Gate-controlled Lateral Pnp Transistor (glPnp)   Using temperature-switching approach to evaluate the ELDRS of bipolar devices 期刊论文  OAI收割 RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2018, 卷号: 172, 期号: 11-12, 页码: 824-834 作者:  Li, XL (Li, Xiaolong);  Lu, W (Lu, Wu);  Wang, X (Wang, Xin);  Guo, Q (Guo, Qi);  Yu, X (Yu, Xin)   |  收藏  |  浏览/下载：30/0  |  提交时间：2018/07/24 Bipolar Technology  Co-60 Gamma Irradiation  Enhanced Low-dose Rate Sensitivity (Eldrs)  Temperature-switching Approach (Tsa)   An Investigation of ELDRS in Different SiGe Processes 期刊论文  OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2017, 卷号: 64, 期号: 5, 页码: 1137-1141 作者:  Li, P (Li, Pei);  He, CH (He, Chaohui);  Guo, HX (Guo, Hongxia);  Guo, Q (Guo, Qi);  Zhang, JX (Zhang, Jinxin) 收藏  |  浏览/下载：39/0  |  提交时间：2017/06/20 Different silicon-germanium (SiGe) process  emitter-base (EB)-spacer geometry  enhanced low dose rate sensitivity (ELDRS)  isolation structure   Theorical model of enhanced low dose rate sensitivity observed in p-type metal-oxide-semiconductor field-effect transistor 期刊论文  OAI收割 ACTA PHYSICA SINICA, 2011, 卷号: 60, 期号: 6 作者:  Gao Bo;  Yu Xue-Feng;  Ren Di-Yuan;  Cui Jiang-Wei;  Lan Bo 收藏  |  浏览/下载：51/0  |  提交时间：2012/11/29 p-type metal-oxide-semiconductor field-effect transistor  Co-60 gamma-ray  total-dose irradiation damage effects  enhanced low dose rate sensitivity   p型金属氧化物半导体场效应晶体管低剂量率辐射损伤增强效应模型研究 期刊论文  OAI收割 物理学报, 2011, 卷号: 60, 期号: 6, 页码: 812-818 作者:  高博;  余学峰;  任迪远;  崔江维;  兰博 收藏  |  浏览/下载：28/0  |  提交时间：2012/11/29 p-type metal-oxide-semiconductor field-effect transistor  60Co gamma-ray  total-dose irradiation damage effects  enhanced low dose rate sensitivity