中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
首页
机构
成果
学者
登录
注册
登陆
×
验证码:
换一张
忘记密码?
记住我
×
校外用户登录
CAS IR Grid
机构
半导体研究所 [7]
采集方式
OAI收割 [5]
iSwitch采集 [2]
内容类型
期刊论文 [6]
会议论文 [1]
发表日期
2005 [1]
2002 [4]
1999 [2]
学科主题
光电子学 [5]
筛选
浏览/检索结果:
共7条,第1-7条
帮助
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
题名升序
题名降序
提交时间升序
提交时间降序
作者升序
作者降序
发表日期升序
发表日期降序
An improved tm method for full two-port calibration of the asymmetric test fixtures
期刊论文
iSwitch采集
Microwave and optical technology letters, 2005, 卷号: 45, 期号: 5, 页码: 438-441
作者:
Zhu, NH
;
Liu, C
;
Pun, EYB
;
Chung, PS
收藏
  |  
浏览/下载:21/0
  |  
提交时间:2019/05/12
Calibration
Deembedding
Microwave network analyzer
Test fixtures
Scattering parameter measurement
New algorithms of the tsm and tom methods for calibrating microwave test fixtures
期刊论文
iSwitch采集
Microwave and optical technology letters, 2002, 卷号: 34, 期号: 1, 页码: 26-31
作者:
Zhu, NH
;
Chen, ZY
;
Wang, YL
收藏
  |  
浏览/下载:27/0
  |  
提交时间:2019/05/12
Microwave network analyzer
Test fixtures
Calibration
Scattering-parameter measurement
Scattering-parameter measurements of laser diodes
期刊论文
OAI收割
optical and quantum electronics, 2002, 卷号: 34, 期号: 8, 页码: 747-757
Zhu NH
;
Liu Y
;
Pun EYB
;
Chung PS
收藏
  |  
浏览/下载:58/0
  |  
提交时间:2010/08/12
microwave network analyzer
scattering-parameter measurement
semiconductor laser diode
test fixture calibration
TEST FIXTURES
CALIBRATION
Choice of calibration equations of the TSM method
会议论文
OAI收割
3rd international conference on microwave and millimeter wave technology, beijing, peoples r china, aug 17-19, 2002
Wang YL
;
Chen ZY
;
Zhu NH
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2010/10/29
calibration
network analyzer
frequency limitation
scattering-parameter measurement
NETWORK-ANALYZER CALIBRATION
TEST FIXTURES
New algorithms of the TSM and TOM methods for calibrating microwave test fixtures
期刊论文
OAI收割
microwave and optical technology letters, 2002, 卷号: 34, 期号: 1, 页码: 26-31
Zhu NH
;
Chen ZY
;
Wang YL
收藏
  |  
浏览/下载:78/0
  |  
提交时间:2010/08/12
microwave network analyzer
test fixtures
calibration
scattering-parameter measurement
NETWORK-ANALYZER CALIBRATION
Correlation of calibration equations for test fixtures
期刊论文
OAI收割
ieee transactions on microwave theory and techniques, 1999, 卷号: 47, 期号: 10, 页码: 1949-1953
Zhu NH
;
Auracher F
收藏
  |  
浏览/下载:48/0
  |  
提交时间:2010/08/12
calibration
microwave network analyzer
scattering-parameter measurement
test fixtures
LINE
NETWORK-ANALYZER CALIBRATION
Phase uncertainty in calibrating microwave test fixtures
期刊论文
OAI收割
ieee transactions on microwave theory and techniques, 1999, 卷号: 47, 期号: 10, 页码: 1917-1922
Zhu NH
收藏
  |  
浏览/下载:67/0
  |  
提交时间:2010/08/12
calibration
microwave network analyzer
scattering-parameter
measurement
test fixtures
PARAMETERS
NETWORK-ANALYZER CALIBRATION