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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
高能物理研究所 [12]
采集方式
OAI收割 [12]
内容类型
期刊论文 [12]
发表日期
2014 [1]
2011 [1]
2010 [2]
2009 [1]
2007 [1]
2005 [2]
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学科主题
Physics [12]
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学科主题:Physics
专题:高能物理研究所
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Mid-gap photoluminescence and magnetic properties of GaMnN films grown by metal-organic chemical vapor deposition
期刊论文
OAI收割
CHINESE PHYSICS B, 2014, 卷号: 23, 期号: 10, 页码: 107803
作者:
Xing HY(邢海英)
;
Xing, HY
;
崔明启;Xu, ZC
;
Cui, MQ
;
Xie, YX
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2016/04/08
GaMnN
photoluminescence
magnetism
metal-organic chemical vapor deposition
Influence of ultrathin amorphous silicon layers on the nucleation of microcrystalline silicon films under hydrogen plasma treatment
期刊论文
OAI收割
APPLIED PHYSICS LETTERS, 2011, 卷号: 98, 期号: 4, 页码: 41902
作者:
Zuo, ZW
;
Guan, WT
;
Wang, Y
;
Lu, J
;
Wang, JZ
收藏
  |  
浏览/下载:13/0
  |  
提交时间:2016/06/29
Different origins of the yellow luminescence in as-grown high-resistance GaN and unintentional-doped GaN films
期刊论文
OAI收割
JOURNAL OF APPLIED PHYSICS, 2010, 卷号: 107, 期号: 2, 页码: 23528
作者:
Xu, FJ
;
Shen, B
;
Lu, L
;
Miao, ZL
;
Song, J
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2016/06/29
gallium compounds
III-V semiconductors
MOCVD
photoluminescence
positron annihilation
vacancies (crystal)
wide band gap semiconductors
Photoluminescence spectroscopy and positron annihilation spectroscopy probe of alloying and annealing effects in nonpolar m-plane ZnMgO thin films
期刊论文
OAI收割
APPLIED PHYSICS LETTERS, 2010, 卷号: 96, 期号: 15, 页码: 151904
作者:
Yang, AL
;
Song, HP
;
Liang, DC
;
Wei, HY
;
Liu, XL
收藏
  |  
浏览/下载:42/0
  |  
提交时间:2016/06/29
alloying
annealing
electrical conductivity
excitons
II-VI semiconductors
magnesium compounds
MOCVD coatings
photoluminescence
positron annihilation
semiconductor thin films
vacancies (crystal)
wide band gap semiconductors
zinc compounds
Positron annihilation in (Ga, Mn)N: A study of vacancy-type defects
期刊论文
OAI收割
APPLIED PHYSICS LETTERS, 2009, 卷号: 94, 期号: 15, 页码: 151907
作者:
Yang, XL
;
Zhu, WX
;
Wang, CD
;
Fang, H
;
Yu, TJ
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2016/06/29
doping profiles
Doppler broadening
ferromagnetic materials
gallium compounds
III-V semiconductors
magnetic thin films
manganese compounds
MOCVD
positron annihilation
semiconductor doping
semiconductor thin films
semimagnetic semiconductors
vacancies (crystal)
wide band gap semiconductors
Studies on surface roughness and growth mechanisms of microcrystalline silicon films by grazing incidence X-ray reflectivity
期刊论文
OAI收割
ACTA PHYSICA SINICA, 2007, 卷号: 56, 期号: 4, 页码: 2422-2427
作者:
Zhou, BQ
;
Liu, FZ
;
Zhu, MF
;
Zhou, YQ
;
Wu, ZH
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2016/06/29
grazing incidence X-ray reflectivity
microcrystalline silicon film
surface roughness
growth mechanism
The microstructure of hydrogenated microcrystalline silicon thin films studied by small-angle x-ray scattering
期刊论文
OAI收割
ACTA PHYSICA SINICA, 2005, 卷号: 54, 期号: 5, 页码: 2172-2175
作者:
Zhou, BQ
;
Liu, FZ
;
Zhu, MF
;
Gu, JH
;
Zhou, YQ
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2016/06/29
hydrogenated microcrystalline silicon thin film
microstructure
micro-voids
small-angle x-ray scattering
Study on the stacking faults in hexagonal GaN grown by epitaxy lateral overgrowth with synchrotron radiation
期刊论文
OAI收割
HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION, 2005, 卷号: 29, 页码: #REF!
作者:
Chen, J
收藏
  |  
浏览/下载:14/0
  |  
提交时间:2016/04/11
GaN
metalorganic chemical vapor deposition (MOCVD)
epitaxy lateral overgrowth
stacking faults
synchrotron radiation X-ray diffraction (XRD)
pole figure
Influence of CO2 reforming of CH4 reaction performance by adding vapor on Ni/CeO2-ZrO2-Al2O3 catalyst
期刊论文
OAI收割
CHINESE JOURNAL OF CHEMICAL PHYSICS, 2004, 卷号: 17, 期号: 1, 页码: #REF!
作者:
Li, CL
;
Fu, YL
;
Ming, M
;
Bian, GZ
;
Xie, YN
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2016/04/12
CO2
reforming of CH4 reaction
steam addition
Ni/CeO2-ZrO2-Al2O3 catalyst
XAFS
coke deposit
Microstructures and strain relaxation in modulation-doped AlxGa1-xN/GaN heterostructures
期刊论文
OAI收割
INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2004, 卷号: 18, 期号: 7, 页码: 989-998
作者:
Tan, WS
;
Shen, B
;
Sha, H
;
Cai, HL
;
Wu, XS
收藏
  |  
浏览/下载:15/0
  |  
提交时间:2016/06/29
high resolution X-ray diffraction
metal organic chemical vapor deposition
reciprocal space mapping
semiconducting III-V nitride
strain relaxation
relaxation line model