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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
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近代物理研究所 [8]
地质与地球物理研究所 [4]
新疆理化技术研究所 [4]
寒区旱区环境与工程研... [1]
武汉物理与数学研究所 [1]
中国科学院大学 [1]
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期刊论文 [17]
会议论文 [2]
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2019 [3]
2018 [1]
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2015 [1]
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Engineering and Microscopic Mechanism of Quantum Emitters Induced by Heavy Ions in hBN
期刊论文
OAI收割
ACS PHOTONICS, 2021, 卷号: 8, 期号: 10, 页码: 2912-2922
作者:
Gu, Rui
;
Wang, Lei
;
Zhu, Huiping
;
Han, Shuangping
;
Bai, Yurong
  |  
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2021/12/13
heavy ion irradiation
hBN
quantum emitters
PL mapping
production efficiency
point defects
Preliminary single event effect distribution investigation on 28 nm soc using heavy ion microbeam
期刊论文
iSwitch采集
Nuclear instruments & methods in physics research section b-beam interactions with materials and atoms, 2019, 卷号: 450, 页码: 323-326
作者:
Yang, Weitao
;
Du, Xuecheng
;
Guo, Jinlong
;
Wei, Junze
;
Du, Guanghua
收藏
  |  
浏览/下载:113/0
  |  
提交时间:2019/10/08
Single event effect (see)
System on chip (soc)
Heavy ion microbeam
On-chip-memory (ocm)
Preliminary single event effect distribution investigation on 28 nm SoC using heavy ion microbeam
期刊论文
OAI收割
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2019, 卷号: 450, 页码: 323-326
作者:
Yang, Weitao
;
Du, Xuecheng
;
Guo, Jinlong
;
Wei, Junze
;
Du, Guanghua
  |  
收藏
  |  
浏览/下载:72/0
  |  
提交时间:2019/11/10
Single event effect (SEE)
System on Chip (SoC)
Heavy ion microbeam
On-chip-memory (OCM)
Comparison of holes trapping and protons transport induced by low dose rate gamma radiation in oxide on different SiGe processes
期刊论文
OAI收割
MICROELECTRONICS RELIABILITY, 2019, 卷号: 103, 期号: 12, 页码: 1-5
作者:
Li, P (Li, Pei)[ 1 ]
;
He, CH (He, ChaoHui)[ 1 ]
  |  
收藏
  |  
浏览/下载:33/0
  |  
提交时间:2020/01/10
SiGe HBTs
Oxide isolation
ELDRS
EHPs generation
Holes trapping
Protons transportation
An intracellular diamine oxidase triggered hyperpolarized Xe-129 magnetic resonance biosensor
期刊论文
OAI收割
CHEMICAL COMMUNICATIONS, 2018, 卷号: 54, 期号: 97, 页码: 5
作者:
Zhou, Xin
;
Ye, Chaohui
;
Liu, Maili
;
Yang, Yunhuang
;
Jiang, Weiping
  |  
收藏
  |  
浏览/下载:77/0
  |  
提交时间:2019/04/30
An Investigation of ELDRS in Different SiGe Processes
期刊论文
OAI收割
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2017, 卷号: 64, 期号: 5, 页码: 1137-1141
作者:
Li, P (Li, Pei)
;
He, CH (He, Chaohui)
;
Guo, HX (Guo, Hongxia)
;
Guo, Q (Guo, Qi)
;
Zhang, JX (Zhang, Jinxin)
收藏
  |  
浏览/下载:32/0
  |  
提交时间:2017/06/20
Different silicon-germanium (SiGe) process
emitter-base (EB)-spacer geometry
enhanced low dose rate sensitivity (ELDRS)
isolation structure
Heavy ion micro-beam study of single-event transient (SET) in SiGe heterjunction bipolar transistor
期刊论文
OAI收割
Science China-Information Sciences, 2017, 卷号: 60, 期号: 12, 页码: 1-3
作者:
Zhang, JX (Zhang, Jinxin)
;
Guo, HX (Guo, Hongxia)
;
Zhang, FQ (Zhang, Fengqi)
;
He, CH (He, Chaohui)
;
Li, P (Li, Pei)
  |  
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2018/01/19
Impact of Bias Conditions on Total Ionizing Dose Effects of Co-60 gamma in SiGe HBT
期刊论文
OAI收割
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2016, 卷号: 63, 期号: 2, 页码: 1251-1258
作者:
Zhang, JX (Zhang, Jinxin)
;
Guo, Q (Guo, Qi)
;
Guo, HX (Guo, Hongxia)
;
Lu, W (Lu, Wu)
;
He, CH (He, Chaohui)
收藏
  |  
浏览/下载:27/0
  |  
提交时间:2016/12/12
Bias conditions
Co-60 gamma irradiation
SiGe HBT
total ionizing dose effect
Evaluation of Mechanical Properties Variations for Kr Ion-Irradiated 6H-SiC by Nanoindentation Methods
期刊论文
OAI收割
INTERNATIONAL JOURNAL OF APPLIED CERAMIC TECHNOLOGY, 2015, 卷号: 12, 页码: 390-398
作者:
Yao, Cunfeng
;
Yang, Tao
;
Zang, Hang
;
He, Chaohui
;
Guo, Daxi
  |  
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2018/07/05
Modifications of SiC under high fluence Kr-ion irradiation at different temperatures
期刊论文
OAI收割
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2013, 卷号: 307, 页码: 558-561
作者:
Yao, Cunfeng
;
Zhang, Peng
;
Wang, Zhiguang
;
He, Chaohui
;
Xi, Jianqi
  |  
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2018/07/05
Sic
Heavy-ion Irradiation
Raman
Mechanical Property
High Fluence