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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
半导体研究所 [27]
新疆理化技术研究所 [3]
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期刊论文 [33]
会议论文 [1]
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2009 [4]
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浏览/检索结果:
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Impact of TID on Within-Wafer Variability of Radiation-Hardened SOI Wafers
期刊论文
OAI收割
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021, 卷号: 68, 期号: 7, 页码: 1423-1429
作者:
Zheng, QW (Zheng, Qiwen) 1
;
Cui, JW (Cui, Jiangwei) 1
;
Yu, XF (Yu, Xuefeng) 1
;
Li, YD (Li, Yudong) 1
;
Lu, W (Lu, Wu) 1
  |  
收藏
  |  
浏览/下载:39/0
  |  
提交时间:2021/08/06
Radiation-hardened (RH)silicon-on-insulator (SOI)total ionizing dose (TID)within-wafer variability
Measurement and Evaluation of the Within-Wafer TID Response Variability on BOX Layer of SOI Technology
期刊论文
OAI收割
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021, 卷号: 68, 期号: 10, 页码: 2516-2523
作者:
Zheng, QW (Zheng, Qiwen) 1Cui, JW (Cui, Jiangwei) 1Yu, XF (Yu, Xuefeng) 1
;
Li, YD (Li, Yudong) 1
;
Lu, W (Lu, Wu) 1
;
He, CF (He, Chengfa) 1
;
Guo, Q (Guo, Qi) 1
  |  
收藏
  |  
浏览/下载:39/0
  |  
提交时间:2021/12/06
Threshold voltage
TestingMOSFET circuits
Transistors
Standards
Logic gates
Fluctuations
Buried oxide (BOX)
silicon-on-insulator (SOI)
total ionizing dose (TID)
Total Ionizing Dose Responses of Forward Body Bias Ultra-Thin Body and Buried Oxide FD-SOI Transistors
期刊论文
OAI收割
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2019, 卷号: 66, 期号: 4, 页码: 702-709
作者:
Zheng, QW (Zheng, Qiwen)[ 1 ]
;
Cui, JW (Cui, Jiangwei)[ 1 ]
;
Xu, LW (Xu, Liewei)[ 2 ]
;
Ning, BX (Ning, Bingxu)[ 3 ]
;
Zhao, K (Zhao, Kai)[ 3 ]
  |  
收藏
  |  
浏览/下载:115/0
  |  
提交时间:2019/05/14
Back-gate biasing
forward body bias (FBB)
total ionizing dose (TID)
ultrathin body and buried oxide fully depleted silicon-on-insulator (UTBB FD-SOI)
The Impacts of Heavy Ion Energy on Single Event Upsets in SOI SRAMs
期刊论文
OAI收割
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 页码: 1091-1100
作者:
Gu, Song
;
Liu, Jie
;
Bi, Jinshun
;
Zhao, Fazhan
;
Zhang, Zhangang
  |  
收藏
  |  
浏览/下载:36/0
  |  
提交时间:2018/07/16
Energy dependence
heavy ions
nuclear reactions
silicon-on-insulator (SOI) technology
single event upset (SEU)
Poly-Silicon Grating Couplers for Efficient Coupling With Optical Fibers
期刊论文
OAI收割
IEEE PHOTONICS TECHNOLOGY LETTERS, 2012, 卷号: 24, 期号: 18, 页码: 1614-1617
Qiu, C
;
Sheng, Z
;
Li, L
;
Pang, A
;
Wang, ZQ
;
Wu, AM
;
Wang, X
;
Zou, SC
;
Gan, FW
收藏
  |  
浏览/下载:19/0
  |  
提交时间:2013/04/17
Complementary metal-oxide-semiconductor (CMOS) technology
silicon-on-insulator (SOI) waveguide
silicon photonics
waveguide grating coupler
A Tunnel Diode Body Contact Structure for High-Performance SOI MOSFETs
期刊论文
OAI收割
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2012, 卷号: 59, 期号: 1, 页码: 101-107
Luo, JX
;
Chen, J
;
Wu, QQ
;
Chai, Z
;
Zhou, JH
;
Yu, T
;
Dong, YJ
;
Li, L
;
Liu, W
;
Qiu, C
;
Wang, X
收藏
  |  
浏览/下载:14/0
  |  
提交时间:2013/04/17
Body contact
floating-body effects (FBEs)
kink effect
linear kink effect (LKE)
partially depleted (PD) silicon-on-insulator (SOI)
SOI MOSFETs
tunnel diode
tunnel diode body contact (TDBC)
Temperature Dependence of Hysteresis Effect in Partially Depleted Silicon-on-Insulator MOSFETs
期刊论文
OAI收割
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2012, 卷号: 12, 期号: 1, 页码: 63-67
Luo, JX
;
Chen, J
;
Zhou, JH
;
Wu, QQ
;
Chai, Z
;
Wang, X
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2013/04/17
Hysteresis
MOSFET
partially depleted (PD) silicon-on-insulator (SOI)
SOI technology
temperature
Experimental study on the subthreshold swing of silicon nanowire transistors
期刊论文
iSwitch采集
Journal of nanoscience and nanotechnology, 2010, 卷号: 10, 期号: 11, 页码: 7113-7116
作者:
Zhang, Yanbo
;
Xiong, Ying
;
Yang, Xiang
;
Wang, Ying
;
Han, Weihua
收藏
  |  
浏览/下载:34/0
  |  
提交时间:2019/05/12
Subthreshold swing (ss)
Silicon-on-insulator (soi)
Nanowire
Wrap gate
Side gates
High-saturation-power and high-speed ge-on-soi p-i-n photodetectors
期刊论文
iSwitch采集
Ieee electron device letters, 2010, 卷号: 31, 期号: 7, 页码: 701-703
作者:
Xue, Hai-Yun
;
Xue, Chun-Lai
;
Cheng, Bu-Wen
;
Yu, Yu-De
;
Wang, Qi-Ming
收藏
  |  
浏览/下载:31/0
  |  
提交时间:2019/05/12
Germanium
Photodetectors
Saturation power
Silicon-on-insulator (soi) technology
Ultrahigh-vacuum chemical vapor deposition (uhv/cvd)
Fabrication of a low-loss ssc using high-dose electron beam lithography exposure with negative pmma resist
期刊论文
iSwitch采集
Ieee photonics technology letters, 2010, 卷号: 22, 期号: 7, 页码: 501-503
作者:
Liu, Yan
;
Xu, Xuejun
;
Xing, Bo
;
Yu, Yude
;
Yu, Jinzhong
收藏
  |  
浏览/下载:23/0
  |  
提交时间:2019/05/12
Silicon-on-insulator (soi)
Spot-size converter (ssc)