机构

• 半导体研究所 [16]

采集方式

• OAI收割 [16]

内容类型

• 期刊论文 [13]
• 会议论文 [3]

发表日期

• 2011 [4]
• 2008 [1]
• 2007 [1]
• 2006 [2]
• 2005 [1]
• 2004 [1]
• 更多

学科主题

• 半导体材料 [16]

筛选

浏览/检索结果: 共16条，第1-10条 帮助 限定条件 学科主题：半导体材料     条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序发表日期升序发表日期降序题名升序题名降序作者升序作者降序 Investigation of cracks in GaN films grown by combined hydride and metal organic vapor-phase epitaxial method 期刊论文  OAI收割 nanoscale research letters, 2011, 卷号: 6, 页码: article no.69 作者:  Song HP;  Wei HY;  Li CM;  Jiao CM 收藏  |  浏览/下载：65/4  |  提交时间：2011/07/05 CATHODOLUMINESCENCE CHARACTERIZATION  GALLIUM NITRIDE  STRESSES  LAYERS  HETEROSTRUCTURE  DEPOSITION  CONSTANTS  MECHANISM  SAPPHIRE  STRAIN   Effect of high temperature AlGaN buffer thickness on GaN Epilayer grown on Si(111) substrates 期刊论文  OAI收割 journal of materials science-materials in electronics, 2011, 卷号: 22, 期号: 8, 页码: 1028-1032 作者:  Pan X 收藏  |  浏览/下载：20/0  |  提交时间：2011/09/14 CHEMICAL-VAPOR-DEPOSITION  PHASE EPITAXY  ALN INTERLAYERS  FILMS  STRESS  LAYERS  DISLOCATIONS  REDUCTION  DENSITY  DIODES   Effect of AlN buffer thickness on GaN epilayer grown on Si(1 1 1) 期刊论文  OAI收割 materials science in semiconductor processing, 2011, 卷号: 14, 期号: 2, 页码: 97-100 Wei, M; Wang, XL; Pan, X; Xiao, HL; Wang, CM; Hou, QF; Wang, ZG 收藏  |  浏览/下载：26/0  |  提交时间：2012/01/06 GaN  MOCVD  Si(111)  AlN  VAPOR-PHASE EPITAXY  LAYERS  SUBSTRATE  MOCVD  STRESS   Growth of GaN film on Si (111) substrate using AlN sandwich structure as buffer 期刊论文  OAI收割 journal of crystal growth, 2011, 卷号: 318, 期号: 1, 页码: 464-467 作者:  Pan X 收藏  |  浏览/下载：80/5  |  提交时间：2011/07/05 Sandwich structure  Stress  Aluminum nitride  Gallium nitride  Silicon  PHONON DEFORMATION POTENTIALS  WURTZITE ALN  SILICON  STRESS  TRANSISTORS  EPITAXY  LAYERS   Effect of indium-doped interlayer on the strain relief in GaN films grown on Si(111) 期刊论文  OAI收割 physica status solidi a-applications and materials science, 2008, 卷号: 205, 期号: 2, 页码: 294-299 Wu, JJ; Zhao, LB; Zhang, GY; Liu, XL; Zhu, QS; Wang, ZG; Jia, QJ; Guo, LP; Hu, TD 收藏  |  浏览/下载：65/3  |  提交时间：2010/03/08 CHEMICAL-VAPOR-DEPOSITION  TEMPERATURE ALN INTERLAYERS  PHASE EPITAXY  OPTICAL-PROPERTIES  SURFACTANT  SUBSTRATE  STRESS  SI  REDUCTION  SAPPHIRE   High responsivity ultraviolet photodetector based on crack-free GaN on Si (111) 会议论文  OAI收割 33rd international symposium on compound semiconductors, vancouver, canada, aug 13-17, 2006 Wang, XY (Wang, Xiaoyan); Wang, XL (Wang, Xiaoliang); Wang, BZ (Wang, Baozhu); Xiao, HL (Xiao, Hongling); Liu, HX (Liu, Hongxin); Wang, JX (Wang, Junxi); Zeng, YP (Zeng, Yiping); Li, JM (Li, Jinmin) 收藏  |  浏览/下载：125/38  |  提交时间：2010/03/29 BUFFER LAYER  STRESS  PHOTODIODES  REDUCTION  DETECTORS  SAPPHIRE  EPITAXY  GROWTH   Crack control in GaN grown on silicon (111) using In doped low-temperature AlGaN interlayer by metalorganic chemical vapor deposition 期刊论文  OAI收割 optical materials, 2006, 卷号: 28, 期号: 10, 页码: 1227-1231 Wu JJ (Wu Jiejun); Han XX (Han Xiuxun); Li JM (Li Jiemin); Wei HY (Wei Hongyuan); Cong GW (Cong Guangwei); Liu XL (Liu Xianglin); Zhu QS (Zhu Qinsheng); Wang ZG (Wang Zhanguo); Jia QJ (Jia Quanjie); Guo LP (Guo Liping); Hu TD (Hu Tiandou); Wang HH (Wang Huanhua) 收藏  |  浏览/下载：48/0  |  提交时间：2010/04/11 in doping  cracks  Si(111) substrate  LT-AlGaN interlayer  metalorganic chemical vapor deposition  GaN  PHASE EPITAXY  INDIUM-SURFACTANT  OPTICAL-PROPERTIES  SI(111)  STRESS  FILMS   Influence of dislocation stress field on distribution of quantum dots 期刊论文  OAI收割 physica e-low-dimensional systems & nanostructures, 2006, 卷号: 33, 期号: 1, 页码: 130-133 作者:  Xu B 收藏  |  浏览/下载：55/0  |  提交时间：2010/04/11 stress  surface structure  semiconducting III-V materials  MOLECULAR-BEAM EPITAXY  STRAIN  THICKNESS   Development of cross-hatch grid morphology and its effect on ordering growth of quantum dots 期刊论文  OAI收割 physica e-low-dimensional systems & nanostructures, 2005, 卷号: 25, 期号: 4, 页码: 592-596 作者:  Jin P;  Xu B 收藏  |  浏览/下载：59/0  |  提交时间：2010/03/17 stress   Depth distribution of the strain in the GaN layer with low-temperature AlN interlayer on Si(111) substrate studied by Rutherford backscattering/channeling 期刊论文  OAI收割 applied physics letters, 2004, 卷号: 85, 期号: 23, 页码: 5562-5564 Lu, Y; Cong, GW; Liu, XL; Lu, DC; Wang, ZG; Wu, MF 收藏  |  浏览/下载：20/0  |  提交时间：2010/03/17 STRESS