中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
机构
采集方式
内容类型
发表日期
学科主题
筛选

浏览/检索结果: 共40条,第1-10条 帮助

条数/页: 排序方式:
InAs/GaSb superlattices grown by LP-MOCVD for similar to 10 mu m wavelength infrared range 期刊论文  OAI收割
infrared physics & technology, 2011, 卷号: 54, 期号: 6, 页码: 478-481
作者:  
YinFei
收藏  |  浏览/下载:16/0  |  提交时间:2012/06/29
Ultrafast photoelectric effects and high-sensitive photovoltages in perovskite oxides and heterojunctions 期刊论文  OAI收割
FRONTIERS OF PHYSICS IN CHINA, 2010, 卷号: 5, 期号: 2, 页码: 176
Guo, EJ; Lu, HB; Jin, KJ; Yang, GZ
收藏  |  浏览/下载:16/0  |  提交时间:2013/09/23
Finite-element study of strain field in strained-Si MOSFET 期刊论文  OAI收割
MICRON, 2009, 卷号: 40, 期号: 2, 页码: 274
Liu, HH; Duan, XF; Xu, QX
收藏  |  浏览/下载:23/0  |  提交时间:2013/09/17
Finite-element study of strain field in strained-Si MOSFET 外文期刊  OAI收割
2009
作者:  
Liu, HH;  Xu, QX;  Duan, XF
  |  收藏  |  浏览/下载:20/0  |  提交时间:2010/11/26
Strain-induced anodization of SiGe/Si multiple layers to form high density SiGe/Si heterogeneous nanorods 期刊论文  OAI收割
solid state communications, 2009, 卷号: 149, 期号: 43-44, 页码: 1897-1901
Zhou B; Pan SW; Chen R; Chen SY; Li C; Lai HK; Yu; JZ; Zhu XF
收藏  |  浏览/下载:63/0  |  提交时间:2010/04/04
Study of strained-silicon channel metal-oxide-semiconductor field effect transistors by large angle convergent-beam electron diffraction 期刊论文  OAI收割
ULTRAMICROSCOPY, 2008, 卷号: 108, 期号: 9, 页码: 816
Liu, HH; Duan, XF; Xu, QX; Liu, BG
收藏  |  浏览/下载:20/0  |  提交时间:2013/09/24
Study of strained-silicon channel metal-oxide-semiconductor field effect transistors by large angle convergent-beam electron diffraction 外文期刊  OAI收割
2008
作者:  
Liu, HH;  Duan, XF;  Xu, QX;  Liu, BG
  |  收藏  |  浏览/下载:20/0  |  提交时间:2010/11/26
On magnon energy branches of multilayer ferrimagnetic superlattices 期刊论文  OAI收割
Physica Status Solidi B-Basic Solid State Physics, 2007, 卷号: 244, 期号: 10, 页码: 3754-3758
R. K. Qiu; Z. D. Zhang
收藏  |  浏览/下载:28/0  |  提交时间:2012/04/13
Nanoscale strain analysis of strained-Si metal-oxide-semiconductor field effect transistors by large angle convergent-beam electron diffraction 期刊论文  OAI收割
APPLIED PHYSICS LETTERS, 2006, 卷号: 88, 期号: 26
Liu, HH; Duan, XF; Qi, XY; Xu, QX; Li, HO; Qian, H
收藏  |  浏览/下载:16/0  |  提交时间:2013/09/24
Nanoscale strain analysis of strained-Si metal-oxide-semiconductor field effect transistors by large angle convergent-beam electron diffraction 外文期刊  OAI收割
2006
作者:  
Liu, HH;  Duan, XF;  Qi, XY;  Xu, QX;  Li, HO
  |  收藏  |  浏览/下载:17/0  |  提交时间:2010/11/26