中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
半导体研究所 [10]
采集方式
OAI收割 [8]
iSwitch采集 [2]
内容类型
期刊论文 [8]
会议论文 [2]
发表日期
2006 [3]
2005 [1]
2004 [1]
2000 [5]
学科主题
半导体材料 [5]
半导体物理 [2]
光电子学 [1]
筛选
浏览/检索结果:
共10条,第1-10条
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Deep level transient spectroscopy studies of Er and Pr implanted GaN films
期刊论文
OAI收割
acta physica sinica, 2006, 卷号: 55, 期号: 3, 页码: 1407-1412
Song SF
;
Chen WD
;
Xu ZJ
;
Xu XR
收藏
  |  
浏览/下载:50/0
  |  
提交时间:2010/04/11
GaN
Er
Pr-implautation
deep level transient spectroscopy
N-TYPE GAN
DEFECTS
EPITAXY
TRAPS
Growth of high quality semi-insulating InP single crystal by suppression of compensation defects
期刊论文
OAI收割
journal of rare earths, 2006, 卷号: 24, 期号: sp.iss.si, 页码: 75-77
Zhao YW
;
Dong ZY
;
Duan ML
;
Sun WR
;
Yang ZX
收藏
  |  
浏览/下载:47/0
  |  
提交时间:2010/04/11
indium phosphide
defect
semi-insualting
STIMULATED CURRENT SPECTROSCOPY
CURRENT TRANSIENT SPECTROSCOPY
SEMI-INSULATING INP
DEEP-LEVEL DEFECTS
FE
Electron irradiation-induced defects in InP pre-annealed at high temperature
期刊论文
OAI收割
materials science in semiconductor processing, 2006, 卷号: 9, 期号: 1-3, 页码: 380-383
Zhao YW (Zhao Y. W.)
;
Dong ZY (Dong Z. Y.)
;
Deng AH (Deng A. H.)
收藏
  |  
浏览/下载:53/0
  |  
提交时间:2010/04/11
indium phosphide
defect
irradiation
THERMALLY STIMULATED CURRENT
UNDOPED SEMIINSULATING INP
DEEP-LEVEL DEFECTS
FRENKEL PAIRS
FE
SPECTROSCOPY
PHOSPHIDE
AMBIENT
TRAPS
Improvement of the electrical property of semi-insulating InP by suppression of compensation defects
会议论文
OAI收割
17th international conference on indium phosphide and related materials, glasgow, scotland, may 08-12, 2005
Zhao, YW
;
Dong, ZY
收藏
  |  
浏览/下载:235/68
  |  
提交时间:2010/03/29
ENCAPSULATED CZOCHRALSKI INP
SEMICONDUCTOR COMPOUND-CRYSTALS
STIMULATED CURRENT SPECTROSCOPY
CURRENT TRANSIENT SPECTROSCOPY
DEEP-LEVEL DEFECTS
ANNEALING AMBIENT
POINT-DEFECTS
FE
PHOSPHIDE
DONORS
Shallow donor defect formation and its influence on semi-insulating indium phosphide after high temperature annealing with long duration
会议论文
OAI收割
13th international conference on semiconducting and insulating materials (simc xiii), beijing, peoples r china, sep 20-25, 2004
Zhao, YW
;
Dong, ZY
;
Zhang, YH
;
Li, CJ
收藏
  |  
浏览/下载:182/52
  |  
提交时间:2010/03/29
DEEP-LEVEL DEFECTS
FE-DOPED INP
GROWN INP
SPECTROSCOPY
RESONANCE
WAFER
The improvement characteristics of homoepitaxial gaas grown by atomic hydrogen-assisted molecular beam epitaxy
期刊论文
iSwitch采集
Journal of infrared and millimeter waves, 2000, 卷号: 19, 期号: 3, 页码: 191-193
作者:
Wang, HL
;
Zhu, HJ
;
Ning, D
;
Wang, H
;
Wang, XD
收藏
  |  
浏览/下载:35/0
  |  
提交时间:2019/05/12
Atomic hydrogen-assisted molecular beam epitaxy
Deep level transient spectroscopy
Deep level defects
Photoluminescence and optical quenching of photoconductivity studies on undoped GaN grown by molecular beam epitaxy
期刊论文
OAI收割
journal of crystal growth, 2000, 卷号: 217, 期号: 3, 页码: 228-232
Xu HZ
;
Wang ZG
;
Harrison I
;
Bell A
;
Ansell BJ
;
Winser AJ
;
Cheng TS
;
Foxon CT
;
Kawabe M
收藏
  |  
浏览/下载:56/0
  |  
提交时间:2010/08/12
GaN
photoluminescence
optical quenching of photoconductivity
native defect level
molecular beam epitaxy
N-TYPE GAN
DEEP-LEVEL DEFECTS
YELLOW LUMINESCENCE
MAGNETIC-RESONANCE
THIN-FILMS
Point defects in III-V compound semiconductors
期刊论文
OAI收割
defects and diffusion in semiconductors, 2000, 卷号: 183-1, 期号: 0, 页码: 85-93
Chen N
收藏
  |  
浏览/下载:53/0
  |  
提交时间:2010/08/12
compound semiconductors
point defects
deep level centres
stoichiometry
MOLECULAR-BEAM EPITAXY
GAAS SINGLE-CRYSTALS
SEMIINSULATING GALLIUM-ARSENIDE
SEMI-INSULATING GAAS
ELECTRICAL-PROPERTIES
LATTICE-PARAMETER
NATIVE DEFECTS
CARBON
DIFFRACTOMETER
STOICHIOMETRY
Point defects in iii-v compound semiconductors
期刊论文
iSwitch采集
Defects and diffusion in semiconductors, 2000, 卷号: 183-1, 页码: 85-93
作者:
Chen, N
收藏
  |  
浏览/下载:21/0
  |  
提交时间:2019/05/12
Compound semiconductors
Point defects
Deep level centres
Stoichiometry
The improvement characteristics of homoepitaxial GaAs grown by atomic hydrogen-assisted molecular beam epitaxy
期刊论文
OAI收割
journal of infrared and millimeter waves, 2000, 卷号: 19, 期号: 3, 页码: 191-193
Wang HL
;
Zhu HJ
;
Ning D
;
Wang H
;
Wang XD
;
Guo ZS
;
Feng SL
收藏
  |  
浏览/下载:92/0
  |  
提交时间:2010/08/12
atomic hydrogen-assisted molecular beam epitaxy
deep level transient spectroscopy
deep level defects
DISLOCATION DENSITY
IRRADIATION