机构

• 近代物理研究所 [38]
• 高能物理研究所 [3]
• 计算技术研究所 [2]
• 电子学研究所 [2]
• 国家空间科学中心 [1]
• 长春光学精密机械与物... [1]
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采集方式

• OAI收割 [47]
• iSwitch采集 [2]

内容类型

• 期刊论文 [34]
• 会议论文 [13]
• 学位论文 [2]

发表日期

• 2022 [1]
• 2021 [6]
• 2020 [3]
• 2019 [3]
• 2018 [4]
• 2017 [11]
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浏览/检索结果: 共49条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Impact of incident direction on neutron-induced single-bit and multiple-cell upsets in 14 nm FinFET and 65 nm planar SRAMs 期刊论文  OAI收割 CHINESE PHYSICS B, 2022, 卷号: 31, 期号: 12, 页码: 126103 作者:  Yang, SH;  Zhang, ZG;  Lei, ZF;  Huang, Y;  Xi, K   |  收藏  |  浏览/下载：19/0  |  提交时间：2023/11/09 neutron  fin field-effect transistor (FinFET)  single event upset (SEU)  Monte-Carlo simulation   Verification of SEU resistance in 65 nm high-performance SRAM with dual DICE interleaving and EDAC mitigation strategies 期刊论文  OAI收割 NUCLEAR SCIENCE AND TECHNIQUES, 2021, 卷号: 32, 期号: 12, 页码: 13 作者:  He, Ze;  Zhao, Shi-Wei;  Liu, Tian-Qi;  Cai, Chang;  Yan, Xiao-Yu   |  收藏  |  浏览/下载：75/0  |  提交时间：2022/01/12 Double interlocked storage cell (DICE)  Error detection and correction (EDAC) code  Heavy ion  Radiation hardening technology  Single event upset (SEU)  Static random-access memory (SRAM)   Design, Application, and Verification of the Novel SEU Tolerant Abacus-Type Layouts 期刊论文  OAI收割 ELECTRONICS, 2021, 卷号: 10, 期号: 23, 页码: 11 作者:     |  收藏  |  浏览/下载：63/0  |  提交时间：2022/04/11 D flip-flop  double interlocked storage cell  single event upset   Design and verification of multiple SEU mitigated circuits on SRAM-based FPGA system 期刊论文  OAI收割 MICROELECTRONICS RELIABILITY, 2021, 卷号: 126, 页码: 7 作者:  Yu, Jian;  Cai, Chang;  Ning, Bingxu;  Gao, Shuai;  Liu, Tianqi   |  收藏  |  浏览/下载：47/0  |  提交时间：2022/01/24 Heavy ions  Irradiation  Hardened  Single event upset   Measurement and evaluation of the Single Event Effects of high-performance SerDes circuits 期刊论文  OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2021, 卷号: 1012, 页码: 11 作者:  Wang, Shu;  Cai, Chang;  Ning, Bingxu;  He, Ze;  Huang, Zhiqin   |  收藏  |  浏览/下载：45/0  |  提交时间：2021/12/08 SerDes  SRAM-based FPGA  Single Event Upset  Single Event Functional Interrupt   Impact of heavy ion energy and species on single-event upset in commercial floating gate cells 期刊论文  OAI收割 MICROELECTRONICS RELIABILITY, 2021, 卷号: 120, 页码: 6 作者:  Ye, Bing;  Mo, Li-Hua;  Zhai, Peng-Fei;  Cai, Li;  Liu, Tao   |  收藏  |  浏览/下载：44/0  |  提交时间：2021/12/09 Flash memories  Linear energy transfer  Single-event upset  Heavy ions  Geant4   Neutron-induced single event upset simulation in Geant4 for three-dimensional die-stacked SRAM* 期刊论文  OAI收割 CHINESE PHYSICS B, 2021, 卷号: 30, 期号: 3, 页码: 8 作者:  Mo, Li-Hua;  Ye, Bing;  Liu, Jie;  Luo, Jie;  Sun, You-Mei   |  收藏  |  浏览/下载：33/0  |  提交时间：2021/12/10 neutron  three-dimension ICs  single event upset  multi-bit upset  Geant4   Influence of Orbital Parameters on SEU Rate of Low-Energy Proton in Nano-SRAM Device 期刊论文  OAI收割 SYMMETRY-BASEL, 2020, 卷号: 12, 期号: 12, 页码: 10 作者:  Ye, Bing;  Mo, Li-Hua;  Liu, Tao;  Sun, You-Mei;  Liu, Jie   |  收藏  |  浏览/下载：35/0  |  提交时间：2021/12/13 SRAM  single-event upset  on-orbit error rate  low-energy proton   Evaluation Method of Heavy-Ion-Induced Single-Event Upset in 3D-Stacked SRAMs 期刊论文  OAI收割 ELECTRONICS, 2020, 卷号: 9, 期号: 8, 页码: 14 作者:  Zhao, Peixiong;  Liu, Tianqi;  Cai, Chang;  He, Ze;  Li, Dongqing   |  收藏  |  浏览/下载：26/0  |  提交时间：2021/12/15 Monte-Carlo simulation  single-event upset  test standard  three-dimensional integrated circuits  ultrahigh-energy heavy ion   Mechanisms of alpha particle induced soft errors in nanoscale static random access memories 期刊论文  OAI收割 ACTA PHYSICA SINICA, 2020, 卷号: 69, 期号: 13, 页码: 9 作者:  Zhang Zhan-Gang;  Ye Bing;  Ji Qing-Gang;  Guo An-Long;  Xi Kai   |  收藏  |  浏览/下载：27/0  |  提交时间：2022/01/12 alpha particle  soft error  single event upset  accelerated test